Literature DB >> 31057889

Nanoimprint lithography steppers for volume fabrication of leading-edge semiconductor integrated circuits.

S V Sreenivasan1,2.   

Abstract

This article discusses the transition of a form of nanoimprint lithography technology, known as Jet and Flash Imprint Lithography (J-FIL), from research to a commercial fabrication infrastructure for leading-edge semiconductor integrated circuits (ICs). Leading-edge semiconductor lithography has some of the most aggressive technology requirements, and has been a key driver in the 50-year history of semiconductor scaling. Introducing a new, disruptive capability into this arena is therefore a case study in a "high-risk-high-reward" opportunity. This article first discusses relevant literature in nanopatterning including advanced lithography options that have been explored by the IC fabrication industry, novel research ideas being explored, and literature in nanoimprint lithography. The article then focuses on the J-FIL process, and the interdisciplinary nature of risk, involving nanoscale precision systems, mechanics, materials, material delivery systems, contamination control, and process engineering. Next, the article discusses the strategic decisions that were made in the early phases of the project including: (i) choosing a step and repeat process approach; (ii) identifying the first target IC market for J-FIL; (iii) defining the product scope and the appropriate collaborations to share the risk-reward landscape; and (iv) properly leveraging existing infrastructure, including minimizing disruption to the widely accepted practices in photolithography. Finally, the paper discusses the commercial J-FIL stepper system and associated infrastructure, and the resulting advances in the key lithographic process metrics such as critical dimension control, overlay, throughput, process defects, and electrical yield over the past 5 years. This article concludes with the current state of the art in J-FIL technology for IC fabrication, including description of the high volume manufacturing stepper tools created for advanced memory manufacturing.

Entities:  

Keywords:  UV nanoimprint; jet and flash imprint; nanoimprint defectivity; nanoscale overlay; precision systems; semiconductor fabrication; steppers

Year:  2017        PMID: 31057889      PMCID: PMC6445000          DOI: 10.1038/micronano.2017.75

Source DB:  PubMed          Journal:  Microsyst Nanoeng        ISSN: 2055-7434            Impact factor:   7.127


  6 in total

1.  Flying plasmonic lens in the near field for high-speed nanolithography.

Authors:  Werayut Srituravanich; Liang Pan; Yuan Wang; Cheng Sun; David B Bogy; Xiang Zhang
Journal:  Nat Nanotechnol       Date:  2008-10-12       Impact factor: 39.213

2.  Large-area, continuous roll-to-roll nanoimprinting with PFPE composite molds.

Authors:  Jacob John; YuYing Tang; Jonathan P Rothstein; James J Watkins; Kenneth R Carter
Journal:  Nanotechnology       Date:  2013-11-27       Impact factor: 3.874

3.  Multilength Scale Patterning of Functional Layers by Roll-to-Roll Ultraviolet-Light-Assisted Nanoimprint Lithography.

Authors:  Markus Leitgeb; Dieter Nees; Stephan Ruttloff; Ursula Palfinger; Johannes Götz; Robert Liska; Maria R Belegratis; Barbara Stadlober
Journal:  ACS Nano       Date:  2016-04-05       Impact factor: 15.881

4.  A nanoplotter with both parallel and serial writing capabilities

Authors: 
Journal:  Science       Date:  2000-06-09       Impact factor: 47.728

5.  Assembly of sub-10-nm block copolymer patterns with mixed morphology and period using electron irradiation and solvent annealing.

Authors:  Jeong Gon Son; Jae-Byum Chang; Karl K Berggren; Caroline A Ross
Journal:  Nano Lett       Date:  2011-10-19       Impact factor: 11.189

6.  Density multiplication and improved lithography by directed block copolymer assembly.

Authors:  Ricardo Ruiz; Huiman Kang; François A Detcheverry; Elizabeth Dobisz; Dan S Kercher; Thomas R Albrecht; Juan J de Pablo; Paul F Nealey
Journal:  Science       Date:  2008-08-15       Impact factor: 47.728

  6 in total
  13 in total

1.  Subwavelength Grating Waveguide Structures Proposed on the Low-Cost Silica-Titania Platform for Optical Filtering and Refractive Index Sensing Applications.

Authors:  Muhammad A Butt; Cuma Tyszkiewicz; Katarzyna Wojtasik; Paweł Karasiński; Andrzej Kaźmierczak; Ryszard Piramidowicz
Journal:  Int J Mol Sci       Date:  2022-06-14       Impact factor: 6.208

Review 2.  Green Nanofabrication Opportunities in the Semiconductor Industry: A Life Cycle Perspective.

Authors:  Eleanor Mullen; Michael A Morris
Journal:  Nanomaterials (Basel)       Date:  2021-04-22       Impact factor: 5.076

3.  Generation of highly integrated multiple vivid colours using a three-dimensional broadband perfect absorber.

Authors:  Soo-Jung Kim; Pil-Hoon Jung; Wonjoong Kim; Heon Lee; Sung-Hoon Hong
Journal:  Sci Rep       Date:  2019-10-16       Impact factor: 4.379

4.  Ultra-fast direct growth of metallic micro- and nano-structures by focused ion beam irradiation.

Authors:  Rosa Córdoba; Pablo Orús; Stefan Strohauer; Teobaldo E Torres; José María De Teresa
Journal:  Sci Rep       Date:  2019-10-01       Impact factor: 4.379

Review 5.  A comprehensive review on plasmonic-based biosensors used in viral diagnostics.

Authors:  Anand M Shrivastav; Uroš Cvelbar; Ibrahim Abdulhalim
Journal:  Commun Biol       Date:  2021-01-15

Review 6.  Multifunctional Structured Platforms: From Patterning of Polymer-Based Films to Their Subsequent Filling with Various Nanomaterials.

Authors:  Madalina Handrea-Dragan; Ioan Botiz
Journal:  Polymers (Basel)       Date:  2021-01-30       Impact factor: 4.329

7.  Nanospike electrodes and charge nanoribbons: A new design for nanoscale thin-film transistors.

Authors:  Kelly Liang; Xin Xu; Yuchen Zhou; Xiao Wang; Calla M McCulley; Liang Wang; Jaydeep Kulkarni; Ananth Dodabalapur
Journal:  Sci Adv       Date:  2022-01-28       Impact factor: 14.136

8.  High-resolution fabrication of nanopatterns by multistep iterative miniaturization of hot-embossed prestressed polymer films and constrained shrinking.

Authors:  Shady Sayed; P Ravi Selvaganapathy
Journal:  Microsyst Nanoeng       Date:  2022-02-14       Impact factor: 7.127

Review 9.  Interfacial Interactions during Demolding in Nanoimprint Lithography.

Authors:  Mingjie Li; Yulong Chen; Wenxin Luo; Xing Cheng
Journal:  Micromachines (Basel)       Date:  2021-03-24       Impact factor: 2.891

10.  UV Nanoimprint Lithography: Geometrical Impact on Filling Properties of Nanoscale Patterns.

Authors:  Christine Thanner; Martin Eibelhuber
Journal:  Nanomaterials (Basel)       Date:  2021-03-23       Impact factor: 5.076

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