| Literature DB >> 30966452 |
Qilong Li1,2, Jiandong Zhang3,4, Xiangqiang Pan5,6, Zhengbiao Zhang7,8, Jian Zhu9,10, Xiulin Zhu11,12.
Abstract
This work developed novel selenium-containing polyimides with a high intrinsic refractive index. Four polyimides with different selenium contents and repeat unit structures were designed and synthesized via amine-dianhydride polycondensation of one of two diamines, i.e., 4,4'-oxydianiline or bis(4-aminophenyl)selanide, with one of two dianhydrides, i.e., bis(4-(3,4-dicarboxylbenzoyloxy)phenyl) ester dianhydride or 1,1'-bis(4-(3,4-dicarboxylbenzoyloxy)phenyl) selenide dianhydride. Various techniques, e.g., nuclear magnetic resonance, Fourier transformed infrared spectroscopy, and wide-angle X-ray diffraction, were used to characterize the polymers' structures. Differential scanning calorimetry, thermogravimetric analysis, ultraviolet-visible spectroscopy, and spectroscopic ellipsometry were used to characterize the properties of the polymers. The selenium contents showed a positive effect on the refractive index of the final polymer. In addition, the refractive index can reach up to 1.968 at 633 nm, which was the highest intrinsic refractive index of a polyimide ever reported. Because of the high intrinsic refractive index, the reflective ratio of visible light on the surface of a silicon wafer was significantly reduced, indicating the potentially utility of the polymer in an anti-reflection coating.Entities:
Keywords: high refractive index; low reflection; polycondensation; polyimide; selenium element
Year: 2018 PMID: 30966452 PMCID: PMC6415271 DOI: 10.3390/polym10040417
Source DB: PubMed Journal: Polymers (Basel) ISSN: 2073-4360 Impact factor: 4.329
Figure 1The structures of four polyimides (PIs) with different contents structures; Se% indicates the theoretical mass contents.
Figure 2Average refractive index curves of four synthesized polyimides at different wavelengths. (nTE, in-plane refractive indices and nTM, out-of-plane refractive indices measured at 633 nm; nav, average refractive indices calculated using the equation nav2 = (2nTE2 + nTM2)/3. Δn, the in-plane/out-of-plane birefringence calculated using the equation Δn = nTE − nTM. vD, average Abbe number calculated by the equation v = (nD − 1)/(nF − nC), nD, nF, and nC represented average refractive indices at 589 nm, 486 nm, and 656 nm, respectively.).
Figure 3SEM images of a textured silicon wafer (a) and four polyimides (PIs) spin-coated on textured silicon wafers ((b) PI-1; (c) PI-2; (d) PI-3; (e) PI-4) under different enlargement ratios.
Figure 4Reflectivity of textured silicon wafers with and without (as a control) the cover of a PI film under different conditions: (A) different PIs with a film thickness of 100 ± 5 nm; (B,C) relationships between R% and PI4 film thickness.