| Literature DB >> 30835773 |
Nathalie Hauk1, Anja S Göritz2, Stefan Krumm1.
Abstract
This study seeks to explain the interplay between chronological age and technology-related strain through techno-stressors and coping strategy choices in organizational settings. Grounded in Lazarus´ stress theory, theories of cognitive aging, the life span theory of control and socioemotional selectivity theory, this study argues that even though older workers are more prone to techno-stressors, aging is connected to gaining coping skills, which in turn reduce technology-related strain over time. Understanding these processes enables modifying employees' coping strategy choices and mitigating negative outcomes of technostress at the workplace. Longitudinal data from 1,216 employees over a time period of 8 months were used to perform multilevel mediation modeling. The findings reveal that age was negatively related to technology-related strain. The link between age and technology-related strain was explained through behavioral disengagement, which older workers used less than younger workers. Active coping and social coping did not act as mediators of this relationship across time points. These relationships were stable after controlling for dependency on technology.Entities:
Mesh:
Year: 2019 PMID: 30835773 PMCID: PMC6400396 DOI: 10.1371/journal.pone.0213349
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Fig 1Research model.
We additionally considered ICT dependency as a control variable in the model by including the direct effect of ICT dependency on all variables.
MLM results on age and techno-stressors.
| Estimate | SE | LL | UL | ||||
| age | -.037 | .031 | .226 | -.088 | .013 | .126 | < .001 |
| dep | .349 | .029 | .000 | .300 | .396 | ||
| Estimate | SE | LL | UL | ||||
| total | -.073 | .032 | .023 | -.125 | -.020 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, tsrt = techno-stressors, dep = ICT dependency
MLM results on age and active coping.
| Estimate | SE | LL | UL | ||||
| age | -.030 | .029 | .286 | -.077 | .017 | .339 | < .001 |
| tstr | .020 | .036 | .568 | -.038 | .079 | ||
| dep | .571 | .035 | .000 | .514 | .628 | ||
| Estimate | SE | LL | UL | ||||
| total | -.090 | .032 | .006 | -.143 | -.037 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, tstr = techno-stressors, dep = ICT dependency
MLM results on age and social coping.
| Estimate | SE | LL | UL | ||||
| age | -.087 | .030 | .003 | -.137 | -.038 | .284 | < .001 |
| tstr | .168 | .035 | .000 | .110 | .225 | ||
| dep | .433 | .035 | .000 | .376 | .490 | ||
| Estimate | SE | LL | UL | ||||
| total | -.144 | .032 | .000 | -.197 | -.090 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, tstr = techno-stressors, dep = ICT dependency
MLM results on age and behavioral disengagement.
| Estimate | SE | LL | UL | ||||
| age | -.114 | .026 | .000 | -.156 | -.072 | .569 | < .001 |
| tstr | .782 | .025 | .000 | .741 | .823 | ||
| dep | -.168 | .030 | .000 | -.217 | -.119 | ||
| Estimate | SE | LL | UL | ||||
| total | -.153 | .034 | .000 | -.210 | -.097 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, tstr = techno-stressors, dep = ICT dependency
Age effects on technology-related strain via techno-stressors and active coping.
| Estimate | SE | LL | UL | ||||
| age | -.068 | .024 | .004 | -.106 | -.029 | .618 | < .001 |
| tstr | .790 | .021 | .000 | .756 | .824 | ||
| active | .012 | .036 | .742 | -.048 | .072 | ||
| dep | -.043 | .033 | .200 | -.097 | .012 | ||
| Estimate | SE | LL | UL | ||||
| total | -.122 | .033 | .000 | -.176 | -.068 | ||
| total indirect | -.054 | .025 | .029 | -.095 | -.013 | ||
| via tstr | -.029 | .024 | .224 | -.069 | .010 | ||
| via active | .000 | .001 | .753 | -.002 | .002 | ||
| via tstr and active | .000 | .000 | .748 | .000 | .000 | ||
| direct effect | -.068 | .024 | .004 | -.106 | -.029 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, active = active coping, tstr = techno-stressors, dep = ICT dependency
Age effects on technology-related strain via techno-stressors and social coping.
| Estimate | SE | LL | UL | ||||
| age | -.065 | .024 | .006 | -.104 | -.026 | .618 | < .001 |
| tstr | .785 | .021 | .000 | .750 | .820 | ||
| social | .030 | .033 | .372 | -.025 | .084 | ||
| dep | -.049 | .029 | .097 | -.049 | .000 | ||
| Estimate | SE | LL | UL | ||||
| total | -.122 | .033 | .000 | -.176 | -.068 | ||
| total indirect | -.057 | .025 | .022 | -.097 | .016 | ||
| via tstr | -.029 | .024 | .222 | -.069 | .010 | ||
| via social | -.003 | .003 | .394 | -.008 | .002 | ||
| via tstr and social | .000 | .000 | .447 | -.001 | .000 | ||
| direct | -.065 | .024 | .006 | -.104 | -.026 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, social = social coping, tstr = techno-stressors, dep = ICT dependency
Age effects on technology-related strain via techno-stressors and behavioral disengagement.
| Estimate | SE | LL | UL | ||||
| age | -.030 | .022 | .175 | -.067 | .007 | .665 | .000 |
| tstr | .531 | .050 | .000 | .449 | .613 | ||
| diseng | .331 | .055 | .000 | .241 | .421 | ||
| dep | .021 | .024 | .380 | -.018 | .059 | ||
| Estimate | SE | LL | UL | ||||
| total | -.122 | .033 | .000 | -.176 | -.068 | ||
| total indirect | -.091 | .027 | .001 | -.136 | -.046 | ||
| via tstr | -.020 | .016 | .226 | -.046 | .007 | ||
| via diseng | -.038 | .011 | .000 | -.055 | -.020 | ||
| via tstr and diseng | -.010 | .008 | .245 | -.023 | .004 | ||
| direct | -.030 | .022 | .175 | -.067 | .007 | ||
Note. Standardized model results, N = 1,216, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, diseng = behavioral disengagement, tstr = techno-stressors, dep = ICT dependency
Fig 2Model with behavioral disengagement.
Standardized path coefficients are given in S4 Table; the dotted lines indicate non-significant effects; ICT dependency was considered as a control variable in the model by including the direct effect of ICT dependency on all variables.
Coping effects on technology-related strain over time.
| trs to strain | Estimate | SE | LL | UL | ||
|---|---|---|---|---|---|---|
| total | .299 | .034 | .000 | .244 | .355 | |
| A | direct | .292 | .034 | .000 | .237 | .347 |
| via active | .007 | .004 | .035 | .002 | .013 | |
| B | direct | .290 | .034 | .000 | .235 | .346 |
| via social | .009 | .004 | .025 | .003 | .016 | |
| C | direct | .266 | .032 | .000 | .213 | .319 |
| via diseng | .033 | .010 | .001 | .017 | .049 | |
Note. Standardized model results, A = mediation model with active coping as mediator, B = mediation model with social coping as mediator, C = mediation model with behavioral disengagement as mediator, SE = standard error, p = two-tailed p-value, LL/ UL = 95% lower-level and upper-level confidence interval, active = active coping, social = social coping, diseng = behavioral disengagement, tstr = techno-stressors, strain = technology-related strain