| Literature DB >> 30813395 |
Florent Bourquard1, Yannick Bleu2, Anne-Sophie Loir3, Borja Caja-Munoz4, José Avila5, Maria-Carmen Asensio6, Gaëtan Raimondi7, Maryam Shokouhi8, Ilhem Rassas9, Carole Farre10, Carole Chaix11, Vincent Barnier12, Nicole Jaffrezic-Renault13, Florence Garrelie14, Christophe Donnet15.
Abstract
Graphene-based materials are widely studied to enable significant improvements in electroanalytical devices requiring new generations of robust, sensitive and low-cost electrodes. In this paper, we present a direct one-step route to synthetize a functional nitrogen-doped graphene film onto a Ni-covered silicon electrode substrate heated at high temperature, by pulsed laser deposition of carbon in the presence of a surrounding nitrogen atmosphere, with no post-deposition transfer of the film. With the ferrocene methanol system, the functionalized electrode exhibits excellent reversibility, close to the theoretical value of 59 mV, and very high sensitivity to hydrogen peroxide oxidation. Our electroanalytical results were correlated with the composition and nanoarchitecture of the N-doped graphene film containing 1.75 at % of nitrogen and identified as a few-layer defected and textured graphene film containing a balanced mixture of graphitic-N and pyrrolic-N chemical functions. The absence of nitrogen dopant in the graphene film considerably degraded some electroanalytical performances. Heat treatment extended beyond the high temperature graphene synthesis did not significantly improve any of the performances. This work contributes to a better understanding of the electrochemical mechanisms of doped graphene-based electrodes obtained by a direct and controlled synthesis process.Entities:
Keywords: electrochemical analysis; graphene; nitrogen-doped graphene; oxygen peroxide oxidation; pulse laser deposition
Year: 2019 PMID: 30813395 PMCID: PMC6416724 DOI: 10.3390/ma12040666
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Synthesis of the N-doped graphene electrode.
Specific deposition parameters of the graphene films.
| Graphene Films | N2 Pressure during Deposition at 780 °C | Additional Period of Annealing at 780 °C after Deposition |
|---|---|---|
| NG-0 | 10−1 mbar | No additional annealing |
| NG-60 | 10−1 mbar | 60 min |
| G-60 | – | 60 min |
| G-90 | – | 90 min |
Figure 2Cyclic voltammetry on (a) NG-0; (b) NG-60; (c) G-60 and (d) G-90 films, in a 0.5 M 1,1′ ferrocene-dimethanol solution of 0.1 M NaClO4. The scan rate was 100 mV/s.
Results of electrochemical measurements on NG and pure graphene films.
| Graphene Films | Anodic Peak Intensity | ∆ | Intensity for 500 mM H2O2 |
|---|---|---|---|
| NG-0 | 4.0 µA | 60 mV | 1200 µA |
| NG-60 | 10 µA | 78 mV | 700 µA |
| G-60 | 5.7 µA | 65 mV | 5 µA |
| G-90 | 8.7 µA | 82 mV | 4 µA |
Figure 3Linear sweep voltammetry of the (a) NG-0; (b) NG-60; (c) G-60 and (d) G-90 films, in the presence of different concentrations of H2O2 in 0.1 M PBS solution (pH 7.4).
Figure 4FEG-SEM images of (a) pure graphene with 60 mn post-deposition annealing; (b) pure graphene with 90 mn post-deposition annealing; (c) N-doped graphene with no post-deposition annealing; (d) N-doped graphene with 60 mn post-deposition annealing. The sub-micrometer texture was attributed to the texturing of the Ni catalyst film caused by thermal annealing. The four images are depicted with the same magnification 1 µm as noted on the image related to NG-60.
Figure 5XPS spectra of the N-doped NG-0 graphene film; (A) XPS 700 eV overview spectrum; (B) XPS 350 eV C1s core level spectrum; (C) XPS 700 eV N1s core level spectrum; and (D) XPS 700 eV O1s core level spectrum.
Figure 6Typical Raman spectra of undoped and N-doped graphene films. The temperature during PLD graphene synthesis was 780 °C in all cases. Post-annealing times (min) are indicated in parentheses.
Figure 7Maps of the Raman (a) 2D/G and (b) D/G intensity ratios recorded at the 442 nm excitation wavelength on a 20 × 20 µm2 area of the pure graphene film annealed at 780 °C for 90 min (G-90). X-Y scales in μm.
Figure 8Maps of the Raman (a) 2D/G and (b) D/G intensity ratios recorded at an excitation wavelength of 442 nm on a 20 × 20 µm2 area of the N-doped graphene film with no post-deposition annealing (NG-0). X-Y scales in μm.
Average Raman fit parameters and parameter ratios for four undoped and doped multilayer graphene samples with different post-annealing durations. The standard deviation for each parameter is in parentheses.
| Samples | Intensity Ratio (Standard Deviation) | Peak Position (cm−1) | Peak Full Width Half Maximum (cm−1) | |||||
|---|---|---|---|---|---|---|---|---|
| 2D/G | D/G | D | G | 2D | D | G | 2D | |
| NG-0 | 0.369 (0.011) | 0.722 (0.032) | 1365.6 (0.7) | 1589.8 (1.7) | 2721.7 (1.9) | 78.2 (2.0) | 73.9 (0.8) | 139 (3.2) |
| NG-60 | 0.386 (0.011) | 0.903 (0.026) | 1366.8 (0.6) | 1595.0 (1.00) | 2724.4 (1.9) | 69.5 (2.1) | 71.0 (1.4) | 129.0 (5.0) |
| G-60 | 0.659 (0.036) | 1.242 (0.029) | 1365.6 (0.8) | 1594.5 (1.0) | 2727.0 (1.7) | 59.5 (1.4) | 68.1 (2.1) | 111.1 (2.6) |
| G-90 | 0.712 (0.060) | 1.183 (0.042) | 1365.9 (0.8) | 1591.9 (1.7) | 2726.2 (2.0) | 60.4 (5.2) | 66.8 (3.1) | 108.4 (4.6) |