Frank C M Spoor1, Gianluca Grimaldi1, Sachin Kinge2, Arjan J Houtepen1, Laurens D A Siebbeles1. 1. Optoelectronic Materials Section, Department of Chemical Engineering, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands. 2. Toyota Motor Europe, Materials Research & Development, Hoge Wei 33, B-1930, Zaventem, Belgium.
Abstract
Carrier multiplication (CM) is the process in which multiple electron-hole pairs are created upon absorption of a single photon in a semiconductor. CM by an initially hot charge carrier occurs in competition with cooling by phonon emission, with the respective rates determining the CM efficiency. Up until now, CM rates have only been calculated theoretically. We show for the first time how to extract a distinct CM rate constant from experimental data of the relaxation time of hot charge carriers and the yield of CM. We illustrate this method for PbSe quantum dots. Additionally, we provide a simplified method using an estimated energy loss rate to estimate the CM rate constant just above the onset of CM, when detailed experimental data of the relaxation time is missing.
Carrier multiplication (CM) is the process in which multiple electron-hole pairs are created upon absorption of a single photon in a semiconductor. CM by an initially hot charge carrier occurs in competition with cooling by phonon emission, with the respective rates determining the CM efficiency. Up until now, CM rates have only been calculated theoretically. We show for the first time how to extract a distinct CM rate constant from experimental data of the relaxation time of hot charge carriers and the yield of CM. We illustrate this method for PbSe quantum dots. Additionally, we provide a simplified method using an estimated energy loss rate to estimate the CM rate constant just above the onset of CM, when detailed experimental data of the relaxation time is missing.
Absorption of a sufficiently
energetic photon in a semiconductor can initially create a hot electron–hole
pair with the electron and/or the hole having excess energy exceeding
the band gap. Such hot charge carriers can cool down to the band edge
by phonon emission, and in addition by excitation of one or more additional
electrons across the band gap. The latter process of carrier multiplication
(CM) leads to generation of two or more electron–hole pairs
for one absorbed photon.[1,2]In the past decade,
many nanomaterials with varying composition, size and shape have been
investigated for the occurrence of CM.[1−3] CM has been found in
0D quantum dots (QDs) in solution[4] and
in thin films,[5,6] 1D nanorods,[7] 2D nanosheets,[8] 2D percolative
networks[9] and bulk material.[10] CM is a promising process to increase the efficiency
of solar energy conversion and has been demonstrated to occur in photovoltaic
devices and solar fuel cells based on 0D, 1D or 2D nanomaterials.[11−15]The quantum yield (QY) for charge carrier photogeneration
(number of charges carriers per absorbed photon) is the net result
of the competitive relaxation of a hot electron–hole pair via
CM and cooling by phonon emission. Therefore, the competition between
CM and cooling has been studied intensively.[16−19] Relaxation times have been experimentally
determined in many materials, with a particular focus on lead selenide
(PbSe) QDs, owing to their well-controlled synthesis and large range
of possible band gap energies through tuning their size.[20] The outcome is that cooling at high energies
relevant to CM is similar in QDs and bulk material.[21−23] However, according
to theoretical calculations CM rates in QDs differ from those for
bulk.[24−27]While quantitative models describing experimental CM QY data
via a competition between CM and cooling exist,[18,19] they employ strong assumptions on the energy dependence of CM and
cooling rates. To our knowledge the most comprehensive study aimed
at finding CM and cooling rates by theoretical analysis of measured
QYs is that of Stewart et al.[18] However,
in that work the rates were taken to be independent of the energy
of the charge carrier. This assumption does not agree with the aforementioned
theoretical calculations, which indicate that the CM rate strongly
depends on charge carrier energy. In addition, our earlier work shows
that the cooling rate also depends on energy. A model that allows
one to extract an energy-dependent CM rate from experiments would
be very valuable for the understanding of the factors that govern
CM.In this work, we derive a method to extract an energy-dependent
CM rate constant from experimental measurements of the relaxation
time of hot charge carriers to band edge states and the QY of electron–hole
pairs. The method is valid up to a carrier excess energy (the energy
of the carrier above the band edge, i.e., Eexcess,e = Ee – ECB for electrons) of twice the band gap. In that case the hot
charge carriers can undergo only one CM event. We use the method to
determine an energy-dependent CM rate constant from our previous experimental
data for PbSe QDs.[23] The method is however
much more generally applicable and can be used to derive CM rate constants
for any material of which experimental results of both the relaxation
time and the QY are available. We also discuss a simplification to
the method using an estimated energy loss rate instead of experimental
data of the relaxation time. This simplified method can be used to
find an estimate of the CM rate constant just above the energetic
threshold of CM using only QY data when experimental data of the relaxation
time of hot charge carriers is not available, as is the case for many
materials that are studied for CM.
Methods
Experimental
Relaxation Time and QY
The carrier cooling data used in this
work are taken from Spoor et al.,[23] where
we reported energetic relaxation of electrons and holes to the band
edges as a function of photoexcitation energy for 3.9 nm PbSe QDs with a band gap of 0.95 eV.
In that work, we determined accurately the relaxation time of the
electrons, shown in Figure a as a function of photon energy. At photoexcitation energies
relevant for CM, starting at twice the band gap energy, the relaxation
time for electrons was found to increase continuously as a function
of photoexcitation energy. The QY data are taken from Spoor et al.,
measured on the same 3.9 nm PbSe QDs used in the cooling study.[28]Figure b shows this QY as a function of photoexcitation energy normalized
by the band gap energy. A straight line is fitted to the data points
above unity to find the CM threshold at 2.7 times the band gap energy
and a CM efficiency given by .
Figure 1
(a) Electron relaxation times as a function of photoexcitation
energy and (b) QY as a function of photoexcitation energy scaled by
the band gap energy for 3.9 nm PbSe QDs as reported in our previous
works.[23,28]
(a) Electron relaxation times as a function of photoexcitation
energy and (b) QY as a function of photoexcitation energy scaled by
the band gap energy for 3.9 nm PbSe QDs as reported in our previous
works.[23,28]
Model of the Electronic Structure
From the data in Figure we wish to extract
a rate constant for CM. To do so we first need to define an electronic
structure for PbSe QDs. Many calculations of the PbSe QD electronic
structure exist,[23,29,30] yielding a high density of states (DOS) at energies relevant for
CM. The situation of a high DOS ensures that electronic states are
always available for energy conservation upon phonon emission by a
charge carrier. Indeed, carrier relaxation was shown to be governed
by phonon emission for charge carriers with high excess energy over
the band gap, as occurs in bulk materials.[21−23] As an approximation,
we can therefore use an electronic structure consisting of N equidistant energy levels, with the distance determined
by the phonon energy, δE, at energies relevant
for CM. We ignore the exact electronic structure near the band edge,
since CM cannot occur from these energy levels. We show such an electronic
structure in Figure a. We label the valence band (VB), conduction band (CB) and the higher
energy levels (with indices 1 to N) from which CM
can occur. Setting the CB energy to 0, the electron energy for which
CM can occur must be at least one band gap energy Ebg. Taking into account only states relevant for CM, we
take level 1 at an energy equal to Ebg. The highest energy level, at which we create a hot electron, is
labeled N.
Figure 2
(a) Electronic structure for PbSe QDs. The CB
energy is set to 0, such that the first energy level from which an
electron can undergo CM has at least the band gap energy Ebg. This energy level is labeled 1. Above the minimal
energy required for CM, we assume equidistant energy levels with N the highest level at which we initially create a hot electron.
Since we only consider single CM events, this energy must be lower
than twice the band gap energy. (b) Possible scenarios of phonon emission
or CM from an energy level i.
(a) Electronic structure for PbSe QDs. The CB
energy is set to 0, such that the first energy level from which an
electron can undergo CM has at least the band gap energy Ebg. This energy level is labeled 1. Above the minimal
energy required for CM, we assume equidistant energy levels with N the highest level at which we initially create a hot electron.
Since we only consider single CM events, this energy must be lower
than twice the band gap energy. (b) Possible scenarios of phonon emission
or CM from an energy level i.In the electronic structure of Figure a, an electron in an energy level i has two possibilities. It either cools down to the energy
level i – 1 below by emitting a phonon or
undergoes CM, as illustrated in Figure b. Upon CM, it decays to a level i < 1. If the electron energy is larger than twice the band gap
energy, the electron theoretically could undergo CM to a level i ≥ 1 and hence undergo CM twice. We consider only
single CM events and therefore consider the highest carrier energy
to be just below twice the band gap energy. This determines our limit
for energy level N (E < 2Ebg). When an
electron in our analysis decays to a level i <
1, it is not considered further, since CM is no longer energetically
allowed. We now define kPE, as the phonon emission rate constant from level i, kCM, as the CM rate
constant from level i, ΔE as
the hot electron energy above the theoretical onset of CM (the electron
energy in level N minus the electron energy in level
1) and δE as the phonon energy, which is the
distance between energy levels, see Figure a. Since we assume that cooling is governed
by phonon emission only, the overall relaxation rate constant equals ktot, = kPE, + kCM,. The probability to either emit a phonon, pPE,, or undergo CM, pCM,, from a certain level i is expressed in terms of the rate constants as
Calculation of the Relaxation
Time and QY
Using the electronic structure of Figure a, we can now identify the
possible relaxation scenarios of a hot electron from any energy level i between 1 and N. For example, if an electron
is created in energy level 2, it can either (i) undergo CM directly,
(ii) emit a phonon in energy level 2 to cool down to energy level
1 and then undergo CM, or (iii) emit a phonon in energy level 2 to
cool down to energy level 1 and subsequently emit a phonon in energy
level 1 to cool down below it. In all three scenarios, the electron
ends up below level 1 and is no longer able to decay via CM. From
this consideration we can calculate the relaxation time from each
energy level to below level 1 for comparison to Figure a. The first relaxation times are given byThe corresponding QYs for
comparison to Figure b can be calculated in a similar manner. Note that the QY is defined
as the total number of charge carriers per absorbed photon. The QY
is therefore always at least unity and becomes higher when CM occurs.
The first QYs are given byThe last right-hand side
expressions in eq indicate
that CM occurs for all decay pathways, except for the case in which
the electron cools down through all energy levels via phonon emission.
For any initial energy level N (with energy such
that only one CM event is possible), we can extend eqs and 3 to
a general result given byWe note that eqs and 5 can be modified
to include multiple CM events, but they become much more complicated
and are not easily fit to the experimental data anymore. We therefore
choose to limit ourselves to the situation of a single CM event.
Relating Experiment and Fits
To fit eqs and 5 to the experimental
data in Figure a,b,
we first need to relate the photoexcitation energy, , to the hot electron energy ΔE (see Figure a) above the theoretical energy threshold of CM. A straightforward
assumption would be to divide the photon energy in excess of the band
gap equally between the electron and hole. This however cannot explain
a CM threshold below three times the band gap energy, such as observed
in Figure b. We therefore
choose to give all the photon excess energy over the band gap to the
electron as an upper limit. Our previous work indicates the existence
of transitions in which the photon excess energy is divided as such.[28,31] With this assumption ΔE can be related to
the photoexcitation energy usingRescaling
the photoexcitation energy according to eq , the number of the energy level N can be determined for each photon energy usingFinally, we prescribe an energy
dependence for the phonon emission and CM rate constants of the formwhere the unit
of α is [eV–β ps–1] since we take ΔE in [eV] and β is
dimensionless. This power law dependence is a heuristic function,
that can however describe the general energy dependence suggested
by theory quite well.[24] We have carried
out the analysis using polynomial functions up to the third order
as well but were able to describe the results most accurately using
the power law dependence of eq .To fit eqs and 5 to the data of Figure a,b, we rescale the photoexcitation
energy hν to ΔE according
to eq . This approach
yields both the relaxation time τ and the QY as a function of
ΔE (the electron excess energy minus one band
gap, ΔE = E – E1 from Figure a). The relaxation time relevant
to CM is however relaxation from the initial electron energy ΔE = –
2Ebg down to ΔE = 0. The experimental relaxation time in Figure a equals cooling to the band edge (ΔE = −Ebg). Hence, we
subtract a constant from the experimental relaxation time, such that
it is zero for ΔE = 0. Any relaxation below
this energy is not relevant for CM. Finally, we perform a global fit
of eqs and 5 to the experimental data of the relaxation time
and the QY as a function of ΔE. We set the
highest energy level N for each data point using eq with a distance of δE = 17 meV between energy levels, equal to the LO phonon
energy in PbSe.[32] The fit parameters we
find from this procedure are the fit parameters α and β
from eq . We note that
fitting to only the relaxation time or the QY, there is freedom in
the fits of kCM and kPE yielding large uncertainties in α and β.
The global fit we perform here with coupled fit parameters does result
in an accurate outcome. We have included the code used to fit eqs and 5 to the experimental data of the relaxation time and QY in the Supporting Information.
Results and Discussion
Fits to the experimental data points for which ΔE < 0.95 eV are shown in Figure a, with the fitted parameters indicated in the figure.
We choose this limit for ΔE because of the
validity of our model for only a single CM event, as discussed above.
We observe that the fit reproduces the experimental data, but with
high uncertainties in the fit parameters up to 100%. The low maximum
value of the QY = 1.11 suggests only a small contribution from multiple
CM events. We can therefore extend the range of our analysis to experimental
data points at ΔE > 0.95 eV. If we do so,
we obtain values of the fit parameters in Figure b (ΔE < 1.4 eV)
and Figure c (ΔE < 1.7 eV) in line with those previously obtained, but
decreasing the uncertainty to a maximum of only 15% for the latter
case. The maximum value of the QY = 1.35 in Figure c is evidently still small enough to neglect
multiple CM events.
Figure 3
Fits of eqs and 5 to the experimental data up to (a) ΔE < 0.95 eV, (b) ΔE < 1.4 eV,
(c) ΔE < 1.7 eV, and (d) ΔE < 2.1 eV. Fit parameters from eq are presented in the figures. The unit of
α is [eV–β ps–1],
and β is dimensionless.
Fits of eqs and 5 to the experimental data up to (a) ΔE < 0.95 eV, (b) ΔE < 1.4 eV,
(c) ΔE < 1.7 eV, and (d) ΔE < 2.1 eV. Fit parameters from eq are presented in the figures. The unit of
α is [eV–β ps–1],
and β is dimensionless.However, the fit becomes worse when we further extend its
range to include the full experimental data (ΔE < 2.1 eV), see Figure d. Surprisingly, the fitted relaxation time even decreases
with energy. This is due to neglecting multiple CM events. When CM
occurs, the electron in our model is taken out of the analysis (moved
to an energy level i < 1 in Figure a). For high enough energy, however, an electron
can undergo CM to an energy level i ≥ 1 from
which CM can occur again. Therefore, this electron continues to cool
down after the first CM event, increasing the total relaxation time.
In our model, however, this electron is considered to be completely
relaxed after the first CM event, resulting in a relaxation time that
is shorter in the fit than in the experiment. Additionally, the CM
rate constant increases with increasing energy according to eq . As the CM rate constant
increases, on average fewer cooling events take place before the first
CM event occurs. If the electron is taken out of the analysis after
this first CM event as discussed above, the relaxation time can decrease
with increasing energy such as observed in the fit of Figure d. Neglecting the relaxation
time after the first CM event is too severe an approximation to describe
the data for the highest ΔE. With a measured
QY = 1.72, the scenario of multiple CM events is likely. We therefore
trust our analysis only up to ΔE < 1.7 eV.The distance, δE, between energy levels
in the electronic structure of Figure a has an influence on the fit through eq . If the distance becomes too large, eqs and 5 will yield a stepwise increase of, respectively, the relaxation
time and the QY as a function of electron excess energy. In Figure a we show fits to
our experimental data using eqs and 5, for different values of δE. We reproduce the fits separately for visibility in the
Supporting Information, Figure S1. We observe
that for large δE, on the order of 100 meV,
indeed the fits have a stepwise character and do not describe the
data as well as the smoother fits for smaller δE. The fits for small δE all yield the same
fit parameters αCM, βCM, and βPE. Only αPE increases from 178 for δE = 17 meV to 300 for δE = 10 meV
to 600 for δE = 5 meV. This is to be expected,
since the phonon emission rate is inversely dependent on the phonon
energy δE if the average energy loss rate (i.e.,
the total relaxation time) remains constant (see eq below). Since we argued before
that δE represents the phonon energy, these
results indicate that cooling in our model can be governed by the
most energetic LO phonons with an energy of 17 meV as well as any
other less energetic phonons. We consider LO phonons the most probable,
since the most energy can be dissipated per step. Most importantly,
the CM rate constant is invariant with the phonon energy δE, if it is small enough.
Figure 4
(a) Fits to the experimental data using eqs and 5 with different values of δE. (b) Phonon emission
rate constant for 17 meV LO phonons and experimental CM rate constant
in 3.9 nm PbSe QDs.
(a) Fits to the experimental data using eqs and 5 with different values of δE. (b) Phonon emission
rate constant for 17 meV LO phonons and experimental CM rate constant
in 3.9 nm PbSe QDs.We finally find a phonon
emission rate constant for 17 meV LO phonons and an experimental CM
rate constant ofin 3.9 nm PbSe QDs, with ΔE in eV. We show these rates as a function of ΔE in Figure b. The energy dependence of the CM rate constant should be related
to both the Coulomb matrix element for CM at the energy of the hot
electron and the density of final biexciton states through Fermi’s
Golden Rule. Theoretical calculations using various methods either
find similar[27] or higher[24,25] CM rate constants than the experimental CM rate constant we find.
We are uncertain what exactly causes the discrepancy. We note however
that the joint DOS for electrons and holes upon photon absorption
in a single, parabolic band semiconductor scales with (hν – Ebg)0.5 and
can be higher when more bands are involved.[33]The above method is applicable to any material for which the
required experimental data is available, taking into account the following
considerations. One should consider carefully how to divide the excess
photon energy between the electron and hole for materials in which
an asymmetric distribution is less likely than in PbSe QDs. Moreover,
depending on theoretical insights and the quality of the fits, the
prescribed energy dependence of the rate constants as given in eq could be chosen differently
to suit the material under investigation. Finally, eqs and 5 can
be modified to include multiple CM events, although this greatly increases
their complexity.
Estimate of the CM Rate Constant from the
QY
The above analysis yields phonon emission and experimental
CM rate constants as a function of electron excess energy from experimental
data of the relaxation time and QY in QDs. The major limitation of eq is that it requires detailed
experimental data of the relaxation time up to high photoexcitation
energy. In literature, such data is very rare. The data of the QY
needed for eq is much
more common for many different materials. We therefore discuss here
a simplified method to estimate the CM rate constant just above the
energetic threshold of CM using only experimental data of the QY.We first need to estimate an energy loss rate. With the experimental
data of the relaxation time from Figure a, we can calculate an average energy loss
rate γ in an energy interval ΔE usingwhere
τ is the relaxation time and hν the photon
energy. We wish to use this average energy loss rate for estimating
a phonon emission rate constant in the electronic structure of Figure a. If relaxation
is only governed by phonon emission, thenThe phonon emission rate in eq is inversely dependent on the phonon energy δE, as mentioned before when we discussed Figure a. Equation neglects any energy lost through CM and
is therefore only valid below the onset of CM. We however approximate kPE just above the energetic threshold of CM
with kPE calculated using eq .The benefit of eqs and 11 is that an energy loss rate and consequently a phonon emission
rate constant can be estimated from experimental data or theoretical
calculations. This can then be used to estimate a CM rate constant
just above the onset of CM. Of course this simplified method is not
as accurate as applying the entire method discussed above and does
not yield a full energy dependence of the CM rate constant, but it
aids in further analyzing existing experimental data.To find
a CM rate constant, we next consider how an electron relaxes through
the electronic structure of Figure a. The probabilities given in eq that an electron either undergoes CM or cools
from a given energy level by emitting a phonon are now constant, because
of the average energy loss rate used from eq . Consequently, the probability that a hot
electron created in energy level N does not undergo
CM and therefore relaxes to below level 1 by emitting N phonons is equal to (pPE). In all other scenarios, the electron undergoes
CM. The total probability of an electron undergoing CM in any of the
energy levels is therefore 1 – (pPE). As such, the QY is given by (recall
that the QY is one plus the yield from CM)Equation is used to estimate the CM rate constant
from experimental data of the QY. It requires an estimate of the phonon
emission rate constant from eq as discussed above. Note that according to eq , the CM rate constant becomes
comparable to the phonon emission rate constant if the QY significantly
exceeds unity. Since we neglected energy lost through CM in eq , we again observe that eq is only valid just above
the onset of CM.We compare the simplified model discussed above
to the full model of eqs and 5 for our experimental data of the relaxation
time and QY in 3.9 nm PbSe QDs. We show in Figure a fits of the full model to the experimental
data prescribing constant phonon emission and CM rate constants, up
to the first data point of the QY exceeding unity. The fitted rate
constants are included in the figure. We observe from Figure a that the fits of the relaxation
time and QY increase linearly with ΔE, as expected
for constant rate constants.
Figure 5
(a) Fits to the experimental data using eqs and 5 for constant phonon emission and CM rate constants. (b) QY as a
function of kCM, calculated using eq , for γ = 2.5 eV/ps,
ΔE = 0.90 eV, and various N. The QY converges for N > 10. (c) QY as a function
of kCM, calculated using eq , for γ = 2.5 eV/ps, ΔE = 0.90 eV, and N = 53. The QY = 1.11
is indicated by the black dashed line and intersects the solution
from eq at kCM = 0.3 ps–1.
(a) Fits to the experimental data using eqs and 5 for constant phonon emission and CM rate constants. (b) QY as a
function of kCM, calculated using eq , for γ = 2.5 eV/ps,
ΔE = 0.90 eV, and various N. The QY converges for N > 10. (c) QY as a function
of kCM, calculated using eq , for γ = 2.5 eV/ps, ΔE = 0.90 eV, and N = 53. The QY = 1.11
is indicated by the black dashed line and intersects the solution
from eq at kCM = 0.3 ps–1.To use eq , we need to find reasonable values for γ and N. From Figure a, we observe that for the first QY data point exceeding unity,
ΔE = 0.90 eV. Using eq we find from the relaxation time that γ
= 2.5 eV/ps for 0 ≤ ΔE ≤ 0.90
eV. With these parameters, we show the QY calculated using eq as a function of kCM in Figure b for different N.From Figure b, we observe that
the QY calculated using eq depends on N but converges for N > 10. If we consider the distance between energy levels, δE, equal to the LO phonon energy in PbSe of 17 meV as before,
we find from eq that N = 53 and kPE = 147 ps–1. With these values of the parameters, we again show
the QY calculated using eq as a function of kCM in Figure c. We also indicate
QY = 1.11 with a black dashed line, equal to the first experimental
QY data point exceeding unity. From Figure c we observe that kCM = 0.3 ps–1 for the QY = 1.11.We
observe from Figure a,c that the CM rate constants determined from our full fit procedure
with constant rate constants and from using eq are equal within the error margin. We therefore
find kCM = 0.3 ps–1
as an estimate just above the energetic threshold of CM. Note that kCM is indeed much smaller than kPE, in agreement with the assumption to obtain eq .For ΔE = 0.90 eV, we find from eq that kCM = 0.8 ps–1 and kPE = 174 ps–1 using the full model of eqs and 5 and both the
experimental relaxation time and QY. The simplified method using eq therefore significantly
underestimates the CM rate constant. It is however useful to estimate
an order-of-magnitude for the CM rate constant when only experimental
data of the QY is available.
Conclusions
We
have presented a method to determine the rate constant of CM for initially
hot charge carriers from experimental data of the relaxation time
and QY. We have illustrated this method for electrons in 3.9 nm PbSe
QDs, for which we find a CM rate of kCM = (0.91 ± 0.05)ΔE(1.5±0.2) ps–1 with ΔE in eV. We
have also derived a simplified method to estimate the CM rate constant
just above the onset of CM when only experimental data of the QY is
available. The method to determine the CM rate constant is generally
applicable to analyze the observed CM efficiency in quantum confined
and bulk materials. Extraction of a distinct CM rate constant can
be useful for screening and direct development of materials with enhanced
CM efficiency.
Authors: John T Stewart; Lazaro A Padilha; M Mumtaz Qazilbash; Jeffrey M Pietryga; Aaron G Midgett; Joseph M Luther; Matthew C Beard; Arthur J Nozik; Victor I Klimov Journal: Nano Lett Date: 2012-01-30 Impact factor: 11.189
Authors: Matthew C Beard; Aaron G Midgett; Mark C Hanna; Joseph M Luther; Barbara K Hughes; Arthur J Nozik Journal: Nano Lett Date: 2010-08-11 Impact factor: 11.189
Authors: Michiel Aerts; C S Suchand Sandeep; Yunan Gao; Tom J Savenije; Juleon M Schins; Arjan J Houtepen; Sachin Kinge; Laurens D A Siebbeles Journal: Nano Lett Date: 2011-09-28 Impact factor: 11.189
Authors: M Tuan Trinh; Arjan J Houtepen; Juleon M Schins; Tobias Hanrath; Jorge Piris; Walter Knulst; Albert P L M Goossens; Laurens D A Siebbeles Journal: Nano Lett Date: 2008-05-20 Impact factor: 11.189