| Literature DB >> 30678208 |
Minas M Stylianakis1, George Viskadouros2,3, Christos Polyzoidis4, George Veisakis5, George Kenanakis6, Nikolaos Kornilios7, Konstantinos Petridis8,9, Emmanuel Kymakis10.
Abstract
Hydroiodic acid (HI)-treated reduced graphene oxide (rGO) ink/conductive polymeric composites are considered as promising cold cathodes in terms of high geometrical aspect ratio and low field emission (FE) threshold devices. In this study, four simple, cost-effective, solution-processed approaches for rGO-based field effect emitters were developed, optimized, and compared; rGO layers were coated on (a) n+ doped Si substrate, (b) n⁺-Si/P3HT:rGO, (c) n⁺-Si/PCDTBT:rGO, and (d) n⁺-Si/PCDTBT:PC71BM:rGO composites, respectively. The fabricated emitters were optimized by tailoring the concentration ratios of their preparation and field emission characteristics. In a critical composite ratio, FE performance was remarkably improved compared to the pristine Si, as well as n⁺-Si/rGO field emitter. In this context, the impact of various materials, such as polymers, fullerene derivatives, as well as different solvents on rGO function reinforcement and consequently on FE performance upon rGO-based composites preparation was investigated. The field emitter consisted of n⁺-Si/PCDTBT:PC71BM(80%):rGO(20%)/rGO displayed a field enhancement factor of ~2850, with remarkable stability over 20 h and low turn-on field in 0.6 V/μm. High-efficiency graphene-based FE devices realization paves the way towards low-cost, large-scale electron sources development. Finally, the contribution of this hierarchical, composite film morphology was evaluated and discussed.Entities:
Keywords: Fowler–Nordheim; cold cathode; field emission; graphene; graphene ink; polymer composites; reduced graphene oxide
Year: 2019 PMID: 30678208 PMCID: PMC6409712 DOI: 10.3390/nano9020137
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1Schematic representation of a field emitter cathode based on hydroiodic acid (HI)-treated reduced graphene oxide (rGO)-charge transfer materials composites.
Figure 2Depictions of GO and rGO structures.
Figure 3Comprehensive depiction of current conduction routes encountered in the studied composite cases.
Figure 4(a) Unmixed rGO ink, (b) P3HT:rGO, and (c) PCDTBT:rGO blends in controlled volume ratios.
Figure 5(a) Logarithmic plot of the current density, measured as a function of the electric field E (J–E), obtained by different concentration ratios of rGO ink in composite n+-Si/P3HT:rGO field emitters. Lowest electrical field threshold appears for the P3HT:rGO(20%) case. (b) Fowler–Nordheim curves of the J–E plots of FE with different concentration ratios of rGO ink in composites n+-Si/PCDTBT:rGO.
Figure 6Variation of the turn on field (black line) and the enhancement factor (blue line) in different concentrations of PCDTBT:PC71BM:rGO and P3HT:rGO composite inks.
Field enhancement factor and turn-on field figures classified per composite type (columns) and for HI/AcOH-reduced rGO ink with diversified ratios.
| rGO Ratio (%) | n+-Si/P3HT:rGO | n+-Si/PCDTBT:rGO | n+-Si/PCDTBT:PC71BM:rGO | |||
|---|---|---|---|---|---|---|
| Field Enhancement β | Turn-on Field | Field Enhancement β | Turn-on Field | Field Enhancement β | Turn-on Field | |
| 100% | 660 ± 10 | 1.60 ± 0.1 | 660 ± 10 | 1.60 ± 0.1 | 660 ± 10 | 1.60 ± 0.1 |
| 80% | 300 ± 10 | 2.23 ± 0.1 | 170 ± 10 | 2.80 ± 0.1 | 80 ± 10 | 2.43 ± 0.1 |
| 60% | 420 ± 10 | 2.05 ± 0.1 | 625 ± 10 | 2.40 ± 0.1 | 360 ± 10 | 2.16 ± 0.1 |
| 40% | 915 ± 10 | 1.53 ± 0.1 | 1090 ± 10 | 1.58 ± 0.1 | 950 ± 10 | 1.53 ± 0.1 |
| 20% | 2500 ± 10 | 1.03 ± 0.1 | 2050 ± 10 | 0.80 ± 0.1 | 2850 ± 10 | 0.60 ± 0.1 |
The ± values denote the standard deviation of each measured or estimated quantity.
Figure 7The evolution of the emission current density at a constant bias voltage of 1500 volts over a long period of continuous operation for the best rGO cathodes measured.
Figure 8Top views of FE cathode surface with clearly visible edges in higher (a) and lower magnification scale (b). Distance among neighboring edges is remarkably close in the order of few microns or less.
Figure 9SEM images of a FE cathode edges in the cases of rGO bundles alone (a) and P3HT(80% v/v):rGO blend(20% v/v) (b). Thickness inhomogeneity due to the applied drop casting method has to be taken into account together with the formation of protruding edges. Impact of rGO sheets is clearly visible especially in (a).