| Literature DB >> 30531798 |
Gina C Adam1, Ali Khiat2, Themis Prodromakis3.
Abstract
Memristive devices have elicited intense research in the past decade thanks to their inherent low voltage operation, multi-bit storage and cost-effective manufacturability. Nonetheless, several outstanding performance and manufacturability challenges have prevented the widespread industry adoption of redox-based memristive matrices. Here, we discuss these challenges in terms of key metrics and propose a roadmap towards realizing competitive memristive-based neuromorphic processing systems.Entities:
Year: 2018 PMID: 30531798 PMCID: PMC6288140 DOI: 10.1038/s41467-018-07565-4
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Matrix-level metrics and manufacturing choices impacting them. a–c Variability metric. The variability is a measure of the spread of device performance (in this example, the two extreme resistance states RON and ROFF) in a memristive matrix as defined based on the standard deviation and the means of the resistance distributions (σ/μ). The variability of the resistance states RON and ROFF across a matrix is heavily influenced by a the choice of active material and of the material stack (e.g., single material HfOx vs. bilayer HfOx + TaOx)[5, 12]; b the device scaling as determined by the smallest feature dimension (also known as critical dimension or CD);[6] and c the presence of a series selector/cell which has its own variability profile[8]. The variability results presented in a–c are extracted from different studies so they have different orders of magnitude depending on the manufacturing process used. d–f Latency metric. The latency is a measure of the delay in accessing the desired device, delay caused by the charging and discharging of the wires. d Impact of the wire downscaling on latency and read margin, which is a measure of the capability to discriminate between the two extreme states (RON and ROFF) of the memristive device[13]. e Practical matrix size limited by latency vs. the density (number of devices in a μm2) allowed by the critical dimension of the manufacturing process. f The impact of the device / selector non-linearity on latency[14]. g–i Density metric discussed from the perspective of the most common device designs—crosspoint, plug-via and vertical. g The availability of materials suitable for each device design, given aspects such as uniformity, conformal deposition, etc. h The state-of-the-art scalability for each design (crosspoint: 2 nm CD/12 nm pitch[9], plug-via ~30 nm/100 nm[15], vertical structure has yet to be optimized for scalability[12]). i State-of-the-art stackability for each design and its approximate cost per matrix layer (represented by the relative size of the bubble)
Fig. 2Roadmap for manufacturing challenges and possible approaches to accelerate progress. Understanding the underlying factors behind variability can be enabled by data-driven research through lab-to-fab designs and very large-scale integration of memristive matrices with traditional digital access circuitry. Benchmarking (performance metrics, standardized device/matrix sizes, methods of testing, etc) will ensure comparable results between groups. Ultimately, once variability and latency issues are tackled, the technology development will benefit from advanced nano-prototyping techniques, such as extreme ultraviolet lithography, for cost-effective scalability and stackability