| Literature DB >> 30487445 |
Krystyna Schneider1, Wojciech Maziarz2.
Abstract
Vanadium pentoxide thin films were deposited onto insulating support by means of rf reactive sputtering from a metallic vanadium target. Argon-oxygen gas mixtures of different compositions controlled by the flow rates were used for sputtering. X-ray diffraction at glancing incidence (GIXD) and Scanning Electronic Microscopy (SEM) were used for structural and phase characterization. Thickness of the films was determined by the profilometry. It has been confirmed by GIXD that the deposited films are composed of V₂O₅ phase. The gas sensing properties of V₂O₅ thin films were investigated at temperatures from range 410⁻617 K upon NO₂ gas of 4⁻20 ppm. The investigated material exhibited good response and reversibility towards nitrogen dioxide. The effect of metal-insulator transition (MIT) on sensor performance has been observed and discussed for the first time. It was found that a considerable increase of the sensor sensitivity occured above 545 K, which is related to postulated metal-insulator transition.Entities:
Keywords: electrical properties; gas sensor; metal-insulator transition (MIT); nitrogen dioxide; reactive sputtering; thin film; vanadium pentoxide
Year: 2018 PMID: 30487445 PMCID: PMC6308542 DOI: 10.3390/s18124177
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Vanadium oxide-based gas sensors, literature survey (published between 2010–2017).
| Gas | Composition | Morphology | Operation | Response | Gas Concentration | Sensitive | Ref. |
|---|---|---|---|---|---|---|---|
| H2 | V2O5 | Thin films | 420–520 | 1.22 | 5–300 H2 | NA | [ |
| Et1, NH3 | V2O5 | Hollow spheres | NA2 | Et:1.02–1.06 | 100–500 | NA | [ |
| NH3 | V2O5 | Thin film | RT | Change of color | 100–400 | H2 | [ |
| Et | V2O5 | Thin film | NA | 1.04 | 100–500 | NA | [ |
| Acetone, CH3OH, HCHO, toluene | VO2 | nanorods | RT3 | 1.015 | 5–100 | NA | [ |
| SO2 | SnO2 + 5 wt% MgO + 2 wt% V2O5 | Thick film | NA | 1.44 | 0.1–1 | NA | [ |
| Et | V2O5 | Thin film | 508 | NA | 2500 | NA | [ |
| xylene | V2O5 | Thin film | 300 | 17 | 800 | NH3, Et, toluene, acetone | [ |
| 1-butyl- | V2O5 | Nanofibres | RT | 1.42 | 0.15–9.5 | NH3, propranolol, toluene | [ |
| NH3 | V2O5 | Composite fibers with polyvinyl acetate and pyrrolidone | 530 | 1.02 | 0.1–0.8 | [ | |
| BTEX4 | SnO2/V2O5 | Composite SnO2/V2O5 | 540 | 5.5–6 | 0.5–50 | Et, CH3OH, | [ |
| CH4 | VO2 | Thin films | 298–473 | 1.008–1.032 | 50–500 | NO2, H2 | [ |
| NH3 | VWT: V2O5–WO3–TiO2 | Potentio- metric: Au V2O5–WO3– | 820 | 0–150 | 10–300 | NA | [ |
| H2O | VO2 (3fl) | Thick film 20-30μm | RT | NA | RH: 35–70% | NA | [ |
| NH3 | V2O5–V7O16 | Thin film | 620 | 1.4 | 0.16–0.32 | NO, CO | [ |
| Et | V2O5 | Thin films | 573–773 | 1.27–1.80 | 500–3000 | NA | [ |
| Et | V2O5 | Nanowiremicroyarns | 600 | 9.09 | 50–1000 | Higher alcohols | [ |
| C4H10S | V2O5 | Thick layer (0.2 mm) from nanopowder | 600 | Catalumine- | 3600–62,000 | Alcohols, alde-hydes, NH3 | [ |
| NOx , H2 | V2O5 + VOx | Thin film composed from nanotubes | 448 | 2.85 | 20–80 NO | CO | [ |
| CH4 | Au–VOx | Porous thin film | RT | NA | 1500 | NA | [ |
| CH4 | C/VOx | C nanotubes filled with VOx | RT | 1.015 | NA | NA | [ |
Symbols: Et1—ethanol (C2H5OH); NA2—not reported; RT3—room temperature (298 K); BTEX4—benzene, toluene, ethylbenzene and xylene.
Vanadium oxide-based semiconducting NO2 sensors.
| Materials | Operation | Concentration | Response | Reference |
|---|---|---|---|---|
| VO2 thin film nanocolumnar | 423 | >100 ppm | 5 | [ |
| V2O5 thin film nanotubes | 563 | 20–80 ppm | 6 | [ |
| V2O5 thin film nanotubes | 448 | 20–80 ppm | 2.9 | [ |
| Composite porous Si/ nanorods V2O5 | 298–523 | 0.25–3 | 5–10 | [ |
| V2O5 thin film | 553–573 | 100 ppm | 1.6 | [ |
| V2O5 thin films composed from-nanorods | 473 | 100 ppm | 1.24 | [ |
| V2O5 thin films 450 nm | 323 | 2–20 ppm | 1.8 | [ |
| V2O5 nanorods | 473 | 100 ppm | 1.75 | [ |
| V2O5 thin films | 410–545 | 4 ppm | 1.16 | This work |
| V2O5 thin films | 546–617 | 4 ppm | 14.4 | This work |
Figure 1Conductometric sensor support from BVT Technologies company.
Figure 2X-ray diffraction patterns for as-sputtered V2O5 thin film.
Figure 3Scanning electron micrographs of: (a) as-sputtered thin film; (b) after annealing at 673 K.
Figure 4Dynamic changes in the electrical resistance of V2O5 thin film upon interaction with 20 ppm NO2, (a) at several temperatures; (b) at 483 K.
Figure 5The sensor response S: (a) vs. temperature for various NO2 concentrations and (b) vs. NO2 concentration for different temperatures.