| Literature DB >> 30486248 |
Lander Urgoiti1,2, David Barrenetxea3, Jose Antonio Sánchez4,5, Iñigo Pombo6, Jorge Álvarez7.
Abstract
Workpiece rejection originated by thermal damage is of great concern in high added-value industries, such as automotive or aerospace. Surface temperature control is vital to avoid this kind of damage. Difficulties in empirical measurement of surface temperatures in-process imply the measurement in points other than the ground surface. Indirect estimation of temperatures demands the use of thermal models. Among the numerous temperature measuring techniques, infra-red measurement devices excel for their speed and accurate measurements. With all of this in mind, the current work presents a novel temperature estimation system, capable of accurate measurements below the surface as well as correct interpretation and estimation of temperatures. The estimation system was validated by using a series of tests in different grinding conditions that confirm the hypotheses of the error made when measuring temperatures in the workpiece below the surface in grinding. This method provides a flexible and precise way of estimating surface temperatures in grinding processes and has shown to reduce measurement error by up to 60%.Entities:
Keywords: dichromatic photodiode; grinding; pyrometry; temperatures
Year: 2018 PMID: 30486248 PMCID: PMC6308806 DOI: 10.3390/s18124134
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Spectral response of each of the cells that comprise the photodiode.
Figure 2Experimental calibration points for the pyrometer presented in this work. (a) Represents the signal on each of the cells during the temperature rise. (b) Is the calibration curve obtained by dividing the values in both sensors.
Theoretical parameter Set 1 (S1) and Set 2 (S2).
| Parameter | Set 1 | Set 2 |
|---|---|---|
| 6.67 | 6.67 | |
| 0.02 | 0.03 | |
| 2 | 1.334 | |
| 2.47 | 3.03 | |
| Acquisition frequency [Hz] | 9000 | 9000 |
Real values of the grinding parameters measured on the tests.
| Test Label | ||||
|---|---|---|---|---|
| S1-1.1 | 0.017 | 2.0 | 2923 | 0.274 |
| S1-1.2 | 0.017 | 2.0 | 2923 | 0.222 |
| S1-2.1 | 0.014 | 2.0 | 2871 | 0.235 |
| S1-2.2 | 0.014 | 2.0 | 2871 | 0.183 |
| S1-3.1 | 0.017 | 2.0 | 3078 | 0.206 |
| S1-3.2 | 0.017 | 2.0 | 3078 | 0.154 |
| S1-4.1 | 0.017 | 2.0 | 2957 | 0.185 |
| S1-4.2 | 0.017 | 2.0 | 2957 | 0.133 |
| S1-5.1 | 0.014 | 2.0 | 3111 | 0.166 |
| S1-5.2 | 0.014 | 2.0 | 3111 | 0.114 |
| S2-1.1 | 0.028 | 1.334 | 2834 | 0.452 |
| S2-1.2 | 0.028 | 1.334 | 2834 | 0.51 |
| S2-2.1 | 0.024 | 1.334 | 2816 | 0.424 |
| S2-2.2 | 0.024 | 1.334 | 2816 | 0.482 |
| S2-3.1 | 0.03 | 1.334 | 2858 | 0.398 |
| S2-3.2 | 0.03 | 1.334 | 2858 | 0.456 |
| S2-4.1 | 0.026 | 1.334 | 2835 | 0.294 |
| S2-4.2 | 0.026 | 1.334 | 2835 | 0.352 |
Figure 3Experimental setup scheme.
Figure 4Temperature distribution in a section of the workpiece at the maximum temperature on the cavity bottom.
Figure 5Photodiode signal (a) and resulting temperature (b).
Figure 6Simulated temperatures of different points of the model representing the temperature distortion caused by the cavity.
Figure 7Maximum measured and simulated temperatures in the cavity in condition set S1 (a) and in S2 (b).
Figure 8Maximum surface temperatures in condition set S1 (a) and in S2 (b).