| Literature DB >> 30453662 |
Naseer Muhammad1,2,3, Tao Fu4, Qiang Liu5,6,7, Xiaopin Tang8,9,10, Zi-Lan Deng11,12, Zhengbiao Ouyang13,14,15.
Abstract
A highly efficient and broad light absorber capable of wide-angle absorption in the visible and near infrared range is presented and numerically investigated for energy harvesting in a simple geometry. According to the calculated results, the proposed device has a peak absorption level of about 99.95%. The actual absorption efficiency is 76.35%, which is approaching that of complex multilayer absorbers with 88 layers working in the wavelength range of 300 nm to 2000 nm. The electro-optic material has the potential of shifting the absorption peak position, compensating fabrication errors and thus reducing the fabrication technique difficulties. Also, the high electro-optic tunability can be used for filters, infrared detection, and imaging applications. More directly, the proposed absorber can be potentially deployed in solar cells and solar thermals.Entities:
Keywords: absorption; electro-optic; energy; metasurface; plasmon
Year: 2018 PMID: 30453662 PMCID: PMC6267289 DOI: 10.3390/ma11112315
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Schematic of the three-dimensional absorber.
Figure 2Absorption spectra of the inner ring, outer ring, two rings, and split rings + split disk (SRSD). The inset shows the electric field distribution of light normalized to the incident field at resonant wavelengths in the zx-plane intersecting the center of unit cell () for the SRSD structure. The white dotted line demonstrates the interface of resonator and substrate.
Total efficiency at different split sizes.
| Parameters | Split | 20 nm | 30 nm | 40 nm | 50 nm | 60 nm |
|---|---|---|---|---|---|---|
|
| 61.28 | 62.02 | 62.51 | 62.86 | 62.36 | |
|
| 62.06 | 61.29 | 61.70 | 61.14 | 62.04 | |
|
| 66.90 | 66.31 | 65.33 | 63.59 | 62.31 |
Figure 3Absorption spectra for different combine split (CS) sizes at (a) r = 80 nm, and (b) r = 90 nm.
Total efficiency at different split sizes.
| Disk Radius |
| 20 nm | 30 nm | 40 nm | 50 nm | 60 nm |
|---|---|---|---|---|---|---|
| 69.98 | 66.94 | 65.27 | 61.68 | 63.99 | ||
| 69.22 | 67.85 | 65.30 | 63.44 | 66.96 |
Total efficiency at different substrate thickness and materials.
| Substrate Thickness |
| 70 nm | 80 nm | 90 nm | 100 nm | 110 nm |
|---|---|---|---|---|---|---|
| AZO | 76.35 | 67.97 | 65.26 | 57.17 | 50.36 | |
| ITO | 75.31 | 66.40 | 62.78 | 55.01 | 48.33 | |
| SiO2 | 70.36 | 67.94 | 68.76 | 64.61 | 60.20 | |
| ZnO | 72.96 | 63.93 | 60.26 | 51.62 | 46.56 |
Figure 4(a) Absorption spectra of different applied voltages V0 at CS = 60 nm and r = 90 nm; (b) influence of incident angle θ on absorption, and (c) relative sensitivity at different eoc values.