| Literature DB >> 30423870 |
Bhuvanesh Srinivasan1, Alain Gellé2, Jean-François Halet3, Catherine Boussard-Pledel4, Bruno Bureau5.
Abstract
GeTe-based materials are emerging as viable alternatives to toxic PbTe-based thermoelectric materials. In order to evaluate the suitability of Al as dopant in thermoelectric GeTe, a systematic study of thermoelectric properties of Ge1-xAlxTe (x = 0⁻0.08) alloys processed by Spark Plasma Sintering are presented here. Being isoelectronic to Ge1-xInxTe and Ge1-xGaxTe, which were reported with improved thermoelectric performances in the past, the Ge1-xAlxTe system is particularly focused (studied both experimentally and theoretically). Our results indicate that doping of Al to GeTe causes multiple effects: (i) increase in p-type charge carrier concentration; (ii) decrease in carrier mobility; (iii) reduction in thermopower and power factor; and (iv) suppression of thermal conductivity only at room temperature and not much significant change at higher temperature. First principles calculations reveal that Al-doping increases the energy separation between the two valence bands (loss of band convergence) in GeTe. These factors contribute for Ge1-xAlxTe to exhibit a reduced thermoelectric figure of merit, unlike its In and Ga congeners. Additionally, divalent Ba-doping [Ge1-xBaxTe (x = 0⁻0.06)] is also studied.Entities:
Keywords: Al-doping; Ba-doping; GeTe; Thermoelectrics; loss of band convergence; lowered zT
Year: 2018 PMID: 30423870 PMCID: PMC6265836 DOI: 10.3390/ma11112237
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1XRD patterns for Ge1−xAlxTe (a) and Ge1−xBaxTe (b) systems.
Hall measurement results (at ~300 K) of carrier concentration (n) and mobility (µ) for Ge1−xAlxTe (x = 0.00–0.08) and Ge1−xBaxTe (x = 0.00–0.06) samples.
| Sample | Carrier Concentration, | Mobility, |
|---|---|---|
| GeTe | 9.08 × 1020 | 57.0 |
| Ge0.98Al0.02Te | 1.75 × 1021 | 21.8 |
| Ge0.96Al0.04Te | 2.88 × 1021 | 10.6 |
| Ge0.94Al0.06Te | 2.17 × 1021 | 12.5 |
| Ge0.92Al0.08Te | 3.01 × 1021 | 8.8 |
| Ge0.98Ba0.02Te | 9.78 × 1020 | 28.2 |
| Ge0.97Ba0.03Te | 9.06 × 1020 | 33.6 |
| Ge0.94Ba0.06Te | 1.62 × 1021 | 16.2 |
Figure 2Temperature-dependent (a) electrical conductivity (σ), (b) Seebeck coefficient (S), and (c) power factor (PF = S2σ), (d) total thermal conductivity (κ), and (e) figure of merit (zT) for Ge1−xAlxTe (x = 0.00–0.08) samples.
Figure 3Temperature-dependent (a) electrical conductivity (σ), (b) Seebeck coefficient (S), and (c) power factor (PF = S2σ), (d) total thermal conductivity (κ), and (e) figure of merit (zT) for Ge1−xBaxTe (x = 0.00–0.06) samples.
Figure 4(a) Calculated DOS for Al2Ge62Te64 (Ge0.97Al0.03Te) model, which is compared with that of the pristine cubic phase Ge64Te64 (c-GeTe). The Fermi level (EF) of pristine c-GeTe is set arbitrarily at 0 eV. The dashed line represents the shifted EF for the doped compositions. Additional Gaussian smearing of 25 meV was applied and the Al projected DOS is magnified for a better readability of the curves. (b) Brillouin zone of c-GeTe. Band structures for (c) c-Ge64Te64 using a 4 × 4 × 4 supercell showing band folding in the Γ → K (∑) direction, and (d) Al2Ge62Te64 (Ge0.97Al0.03Te) highlighting Al projections. Line thickness is proportional to the projection of the wave function on the Al (in red) orbitals.