| Literature DB >> 30356918 |
Jin Xu1, Datao Tu1, Wei Zheng1, Xiaoying Shang1, Ping Huang1, Yao Cheng1, Yuansheng Wang1, Xueyuan Chen1.
Abstract
Homogeneous core-shell structured nanoparticles (NPs) are prevailingly designed to accommodate lanthanide emitters, and such an epitaxial shell deposited on core NP is generally believed to help eliminate surface traps or defects on the as-prepared core. However, upon electron-beam irradiation to core-shell-shell NaLuF4:Gd/Yb/Er@NaLuF4:Nd/Yb@NaLuF4 upconversion NPs (UCNPs), it is revealed that interfacial defects actually exist at the core-shell and shell-shell interfaces, even with a higher density than the bulk-phase defects in inner core. Because of such higher density of interfacial defects, the kinetic energies transferred from energetic electrons to atoms may trigger the faster Na/F atom ejections and outward atom migrations in the coating layers than in the inner core of NPs, which ultimately results in the in situ formation of novel yolk-shell UCNPs. These findings provide new insights into interfacial defects in homogeneous core-shell structured NaLnF4 NPs, and pave the way toward utilizing the interactions of high-energy particles with materials for in situ fabrication of novel nanostructures.Entities:
Keywords: electron‐beam irradiation; in situ fabrication; interfacial defects; yolk–shell upconversion nanoparticles
Year: 2018 PMID: 30356918 PMCID: PMC6193145 DOI: 10.1002/advs.201800766
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 16.806
Figure 1Schematic illustration of in situ fabrication of yolk–shell NaLuF4 UCNPs by e‐beam irradiation.
Figure 2TEM images of core–shell–shell NPs a) before and b) after e‐beam irradiation for 30 s. c) TEM images of a yolk–shell NP with tilting angles from 0° to 20°. TEM images of core‐only NaLuF4:Gd/Yb/Er NPs d) before and after e) 60 and f) 90 s e‐beam irradiation.
Figure 3a) TEM image of core–shell–shell NPs after 30 s irradiation with a current density of 1.6 A cm−2. b) TEM image of NPs shown in (a) after an additional 30 s irradiation with a current density of 40 A cm−2. c) σK for Lu atom as a function of E d. The inset shows calculated ΔE for atoms with different M values. d) Calculated σK for atoms with different Z values by setting E d = 1.0 eV.
Figure 4TEM images of NaLuF4:Gd/Yb/Er@NaYF4:Nd/Yb@NaLuF4 NPs a) before and b) after e‐beam irradiation for 120 s. The bottom and top insets of (a) show the high‐angle annular dark‐field scanning transmission electron microscopy (HAADF‐STEM) image and EDX line scan, respectively. TEM images of NaLuF4:Gd/Yb/Er@NaYF4:Nd/Yb NPs c) before and d) after e‐beam irradiation for 120 s.
Figure 5TEM images of three‐shell NaLuF4 UCNPs (42.7 nm) before a) and after b) e‐beam irradiation for 30 s. TEM images of four‐shell NaLuF4 UCNPs (51.9 nm) before c) and after d) e‐beam irradiation for 30 s.