| Literature DB >> 30352490 |
Hyun Yong Koh1, Jeong Ho Lee1,2.
Abstract
During the cortical development, cells in the brain acquire somatic mutations that can be implicated in various neurodevelopmental disorders. There is increasing evidence that brain somatic mutations lead to sporadic form of epileptic disorders with previously unknown etiology. In particular, malformation of cortical developments (MCD), ganglioglioma (GG) associated with intractable epilepsy and non-lesional focal epilepsy (NLFE) are known to be attributable to brain somatic mutations in mTOR pathway genes and others. In order to identify such somatic mutations presenting as low-level in epileptic brain tissues, the mutated cells should be enriched and sequenced with high-depth coverage. Nevertheless, there are a lot of technical limitations to accurately detect low-level of somatic mutations. Also, it is important to validate whether identified somatic mutations are truly causative for epileptic seizures or not. Furthermore, it will be necessary to understand the molecular mechanism of how brain somatic mutations disturb neuronal circuitry since epilepsy is a typical example of neural network disorder. In this review, we overview current genetic techniques and experimental tools in neuroscience that can address the existence and significance of brain somatic mutations in epileptic disorders as well as their effect on neuronal circuitry.Entities:
Keywords: epilepsy; epileptogenesis; network; next generation sequencing; somatic mutation
Mesh:
Year: 2018 PMID: 30352490 PMCID: PMC6199569 DOI: 10.14348/molcells.2018.0247
Source DB: PubMed Journal: Mol Cells ISSN: 1016-8478 Impact factor: 5.034
Somatic mutations related to epileptic disorder.
| Genes | Disorder | Affected/total (%) | Platform | Variant | Average depth or read count | Mutant allele (%) | Biological validation | References |
|---|---|---|---|---|---|---|---|---|
| FCD II | 2/4 (50) | WES | c.7280T>C | X412–668 | 6–12 | Yes | ( | |
| 10/73 (13.7) | TS | c.1871G>A, c.4348T>G, c.4447T>C, c.5126G>A, c.5930C>A, c.6577C>T, c.6644C>T, c.7280T>A | X100–347499 | 1–7 | Yes | |||
| 6/13 (46.2) | WES | c.4376C>A, c.4379T>C, c.6644C>T, c.6644C>A | X100–260 | 1.1–9.3 | Yes | ( | ||
| 1/1 (100) | WES | c.4487T>G | >X80 | 8.3 | No | ( | ||
| 4/8 (50) | WES | c.4379T>C, c.6644C>T, c.6644C>A | X50–60 | 1.2–6.0 | Yes | ( | ||
| FCD | 6/20 (30) | TS | c.4379T>C, c.6644C>T, c.6644C.A | >X2300 | 1.1–6.3 | No | ( | |
| 4/52 (7.7) | TS | c.4379T>C, c.4447T>C, c.6644C>A, c.5930C>G | >X5000 | 2.3–10.6 | No | ( | ||
| HME | 1/20 (5) | WES | c.4448C>T | 23–159 reads | 17.14 | No | ( | |
| 3/38 (7.9) | TS | c.6644C>T, c.6644C>A, c.5930C>A | >X5000 | 7.1–20.6 | No | ( | ||
| SWS | 23/26 (88.5) | TS | c.548G>A | X2400–93000 | 1.0–18.1 | Yes | ( | |
| 12/15 (80) | TS | c.548G>A | X708528 | 3.7–8.9 | No | ( | ||
| FCD II | 4/40 (10) | TS | c.610C>T, c.64C>T | X100–20012 | 1–2 | Yes | (J. S. | |
| 1/52 (1.9) | TS | c.384C>T | >X5000 | 5.1–6.7 | No | ( | ||
| FCD II | 1/40 (2.5) | TS | c.4639G>A | X100–20012 | 1–2 | Yes | (J. S. | |
| FCD | 1/52 (1.9) | TS | c.2251C>T | >X5000 | 1.0 | No | ( | |
| HME | 2/38 (5.3) | TS | c.1759A>T, c.4672G>A | >X5000 | 3.1–3.8, 7.5–11.6 | No | ( | |
| HME | 1/20 (5) | WES | c.49C>T | 23–159 reads | 28 | No | ( | |
| 1/8 (12.5) | TS | c.49G>A | - | 4–17 | Yes | ( | ||
| 1/33 (3) | TS | c.49C>T | X567 | 10–18 | Yes | ( | ||
| 1/38 (2.6) | TS | c.49C>T | >X5000 | 3.4–4.4 | No | ( | ||
| 1/14 (7.1) | TS | c.49G>A | - | 8–14 | Yes | ( | ||
| HME | 1/38 (2.6) | TS | c.49G>A | >X5000 | 8.1–9.3 | No | ( | |
| HME | 4/20 (20) | WES | c.1633G>A | 23–159 reads | 28–30 | Yes | ( | |
| 1/39 (2.6) | WES | c.3140A>G | - | 13 | No | ( | ||
| 1/39 (2.6) | WES | c.1624G>A | - | 28 | No | ( | ||
| FCD II | 1/33 (3) | TS | c.3140A>G | X567 | 4.7 | Yes | ( | |
| FCD II | 1/10 (10) | TS | c.865C>T | X1505 | 10 | Yes | ( | |
| NLFE | 3/18 (16.7) | WES | c.910T>C, c.634_635del, c.634_635del, | X137–492 | 2–14 | No | ( | |
| FCD I | 2/38 (5.3) | WES | c.164G>T, c.747_757dup | 19–53 | No | |||
| BAVM | 4/26 (15.4) | WES | c.35G>A, c.35G>T | X339±64 | 2.4–4.0 | Yes | ( | |
| DCS (SBH) | 3/30 (10) | TS | c.556C>T, c.233G>T, 1270-1G>A | >X200 | 5–15 | No | ( | |
| DCS (SBH) | 3/30 (10) | TS | c.190A>T, 1002+1G>A, Chr17:2583480:G>C | >X200 | 13–26 | No | ||
| PVNH | 1/61 (1.6) | TS | S1449Pfs*10 | >X200 | 35 | No | ||
| PAC | 1/47 (2) | TS | Chr6:3225184:G>C | >X200 | 23 | No |
Abbreviation: TS, targeted sequencing; WES, whole exome sequencing; SWS, Sturge Weber syndrome; FCD, focal cortical dysplasia; HME, hemimegalencephaly; GG, ganglioglioma; NLFE, nonlesional focal epilepsy; BAVM, brain arteriovenous malformation; DCS, double cortex syndrome (SBH, subcortical band heterotopia); PVNH, paraventricular nodular hyperplasia; PAC, pachygyria.
Fig. 1Process to discover brain somatic mutations in intractable epilepsy
(A) Post operation MRI image of epilepsy surgery and specimen collection process. (B) Enrichment of mutation carrying cells for sequencing ready samples. Note that percentage of cells with mutations is much higher than before enrichment. (C) Example of read stacks implying necessity of high coverage depth genome wide sequencing to emphasize epilepsy causing mutation without false negative.
Fig. 2In vivo epilepsy model with brain somatic mutations
(A) Schematic process of in utero electroporation of epilepsy causing genes. Scale bar = 5mm. (B) Viral injection of epilepsy causing mutated gene in focal brain region. SSc, somatosensory cortex. (C) Immunofluorescence image of electroporated region of brain. Scale bar = 50μm. Note that the proportion of mutant cells is only about 3%, despite being the brightest region of the cortex. (D) Electroencephalography of mouse model carrying brain somatic mutation during seizure attack. (E) Rapamycin, MTOR inhibitor, injection into intraperitoneal space of brain somatic mutated mouse. The frequency of seizure in Rapamycin treated group (n = 6 mice) is significantly decreased compared to control (n = 9 mice) or vehicle injected group (n = 6 mice). One-way ANOVA with Dunn’s multiple comparison test. **P < 0.01. (E) Short- and long-range network affected by somatic mutations.