| Literature DB >> 30334515 |
Dipendra Jha1, Saransh Singh2, Reda Al-Bahrani1, Wei-Keng Liao1, Alok Choudhary1, Marc De Graef2, Ankit Agrawal1.
Abstract
We present a deep learning approach to the indexing of electron backscatter diffraction (EBSD) patterns. We design and implement a deep convolutional neural network architecture to predict crystal orientation from the EBSD patterns. We design a differentiable approximation to the disorientation function between the predicted crystal orientation and the ground truth; the deep learning model optimizes for the mean disorientation error between the predicted crystal orientation and the ground truth using stochastic gradient descent. The deep learning model is trained using 374,852 EBSD patterns of polycrystalline nickel from simulation and evaluated using 1,000 experimental EBSD patterns of polycrystalline nickel. The deep learning model results in a mean disorientation error of 0.548° compared to 0.652° using dictionary based indexing.Entities:
Keywords: EBSD; convolutional neural networks; deep learning; electron backscatter diffraction
Year: 2018 PMID: 30334515 DOI: 10.1017/S1431927618015131
Source DB: PubMed Journal: Microsc Microanal ISSN: 1431-9276 Impact factor: 4.127