Literature DB >> 30229878

Reflectance confocal microscopy of tinea capitis: comparing images with results of dermoscopy and mycological exams.

John V Veasey1, Olivia M S Meneses2, Fabiana O da Silva2.   

Abstract

Entities:  

Mesh：

Year:  2018        PMID： 30229878     DOI： 10.1111/ijd.14241

Source DB:  PubMed          Journal:  Int J Dermatol        ISSN： 0011-9059            Impact factor:   2.736


× No keyword cloud information.
  4 in total

1.  Nail Clipping with PAS Stain and Correlation with Fungi Isolated in Culture: A Valuable Exchange in the Diagnosis of Onychomycosis.

Authors:  Flávia Trevisan; John Verrinder Veasey; Betina Werner
Journal:  Skin Appendage Disord       Date:  2022-05-05

2.  A Hundred Years of Diagnosing Superficial Fungal Infections: Where Do We Come From, Where Are We Now and Where Would We Like To Go?

Authors:  Yvonne Gräser; Ditte M L Saunte
Journal:  Acta Derm Venereol       Date:  2020-04-20       Impact factor: 3.875

3.  Beware of reflectance confocal microscopy artifacts when searching hyphae in acral skin - Reply.

Authors:  John Verrinder Veasey
Journal:  An Bras Dermatol       Date:  2019-12-30       Impact factor: 1.896

4.  Tinea Capitis: Correlation of Clinical Aspects, Findings on Direct Mycological Examination, and Agents Isolated from Fungal Culture.

Authors:  Rebeca Ruppert Galarda Baptista Peixoto; Olivia Mercilene Silva Meneses; Fabiana Oliveira da Silva; Aline Donati; John Verrinder Veasey
Journal:  Int J Trichology       Date:  2019 Nov-Dec
  4 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.