Literature DB >> 30188684

In2O3 Nanowire Field-Effect Transistors with Sub-60 mV/dec Subthreshold Swing Stemming from Negative Capacitance and Their Logic Applications.

Qian Xu1,2, Xingqiang Liu1,3, Bensong Wan1, Zheng Yang1,2, Fangtao Li1, Junfeng Lu1, Guofeng Hu1, Caofeng Pan1,2,4, Zhong Lin Wang1,2,5.   

Abstract

Heat dissipation is a key issue for scaling metal-oxide-semiconductor field-effect transistors (MOSFETs). The Boltzmann distribution of electrons imposes a physical limit on the subthreshold swing (SS), which impedes both the reduction of the switching energy and the further increase of the device density. The negative capacitance effect is proposed to rescue MOSFETs from this phenomenon called "Boltzmann tyranny". Herein, we report In2O3 nanowire (NW) transistors with SS values in the sub-60 mV/dec region, which utilize the ferroelectric P(VDF-TrFE) as the dielectric layer. An ultralow SS down to ∼10 mV/dec is observed and spans over 5 orders of magnitude in the drain current. Meanwhile, a high on/off ratio of more than 108 and a transconductance ( gm) of 2.3 μS are obtained simultaneously at Vd = 0.1 V. The results can be understood by the "voltage amplification" effect induced from the negative capacitance effect. Moreover, the steep slope FET-based inverters indicate a high voltage gain of 41.6. In addition to the NOR and NAND gates, the Schmitt trigger inverters containing only one steep slope FET are demonstrated. This work demonstrates an avenue for low-power circuit design with a steep SS.

Entities:  

Keywords:  In2O3; field-effect transistors; logic circuit; negative capacitance; subthreshold swing

Year:  2018        PMID: 30188684     DOI: 10.1021/acsnano.8b05604

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  2 in total

1.  High performance indium oxide nanoribbon FETs: mitigating devices signal variation from batch fabrication.

Authors:  Thuy Thi Thanh Pham; Duy Phu Tran; Benjamin Thierry
Journal:  Nanoscale Adv       Date:  2019-11-05

2.  Simulation and Modeling of Novel Electronic Device Architectures with NESS (Nano-Electronic Simulation Software): A Modular Nano TCAD Simulation Framework.

Authors:  Cristina Medina-Bailon; Tapas Dutta; Ali Rezaei; Daniel Nagy; Fikru Adamu-Lema; Vihar P Georgiev; Asen Asenov
Journal:  Micromachines (Basel)       Date:  2021-06-10       Impact factor: 2.891

  2 in total

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