| Literature DB >> 30146718 |
Ondrej Dyck1,2, Songkil Kim3, Elisa Jimenez-Izal4,5, Anastassia N Alexandrova5,6, Sergei V Kalinin1,2, Stephen Jesse1,2.
Abstract
Building materials from the atom up is the pinnacle of materials fabrication. Until recently the only platform that offered single-atom manipulation was scanning tunneling microscopy. Here controlled manipulation and assembly of a few atom structures are demonstrated by bringing together single atoms using a scanning transmission electron microscope. An atomically focused electron beam is used to introduce Si substitutional defects and defect clusters in graphene with spatial control of a few nanometers and enable controlled motion of Si atoms. The Si substitutional defects are then further manipulated to form dimers, trimers, and more complex structures. The dynamics of a beam-induced atomic-scale chemical process is captured in a time-series of images at atomic resolution. These studies suggest that control of the e-beam-induced local processes offers the next step toward atom-by-atom nanofabrication, providing an enabling tool for the study of atomic-scale chemistry in 2D materials and fabrication of predefined structures and defects with atomic specificity.Entities:
Keywords: atomic control; electron beam; graphene; scanning transmission electron microscope; silicon dimer
Year: 2018 PMID: 30146718 DOI: 10.1002/smll.201801771
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281