Literature DB >> 30116686

Development of a Vacuum Electrospray Droplet Ion Gun for Secondary Ion Mass Spectrometry.

Satoshi Ninomiya1, Yuji Sakai2, Lee Chuin Chen1, Kenzo Hiraoka2.   

Abstract

Atmospheric pressure electrospray had been used in previous studies to generate massive water droplet ion beams, and the beams successfully achieved efficient desorption/ionization of biomolecules, low damage etching of polymers and nonselective etching of metal oxides. However, this droplet ion beam was not practical as a primary ion beam for surface analysis instruments because it required differential pumping and lacked adequate beam current and density. To improve the beam performance, we have proposed to use vacuum electrospray of aqueous solutions as a beam source, and developed a technique for producing a stable electrospray of aqueous solution in vacuum. We also designed a prototype of a vacuum electrospray droplet ion gun, and measured the beam properties. Finally, the applicability of this ion gun in secondary ion mass spectrometry is discussed.

Entities:  

Keywords:  massive cluster ion beam; secondary ion mass spectrometry; vacuum electrospray

Year:  2018        PMID: 30116686      PMCID: PMC6089089          DOI: 10.5702/massspectrometry.A0069

Source DB:  PubMed          Journal:  Mass Spectrom (Tokyo)        ISSN: 2186-5116


  23 in total

1.  A C60 primary ion beam system for time of flight secondary ion mass spectrometry: its development and secondary ion yield characteristics.

Authors:  Daniel Weibel; Steve Wong; Nicholas Lockyer; Paul Blenkinsopp; Rowland Hill; John C Vickerman
Journal:  Anal Chem       Date:  2003-04-01       Impact factor: 6.986

2.  Vacuum electrospray of volatile liquids assisted by infrared laser irradiation.

Authors:  Satoshi Ninomiya; Lee Chuin Chen; Hiroaki Suzuki; Yuji Sakai; Kenzo Hiraoka
Journal:  Rapid Commun Mass Spectrom       Date:  2012-04-15       Impact factor: 2.419

3.  Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.

Authors:  P Sjövall; D Rading; S Ray; L Yang; A G Shard
Journal:  J Phys Chem B       Date:  2010-01-21       Impact factor: 2.991

4.  Electrospray droplet impact secondary ion mass spectrometry using a vacuum electrospray source.

Authors:  R Takaishi; Y Sakai; K Hiraoka; H Wada; S Morita; T Nakashima; H Nonami
Journal:  Rapid Commun Mass Spectrom       Date:  2015-08-15       Impact factor: 2.419

5.  Secondary ion yields for vacuum-type electrospray droplet beams measured with a triple focus time-of-flight analyzer.

Authors:  Satoshi Ninomiya; Yuji Sakai; Ryo Watanabe; Mauo Sogou; Takuya Miyayama; Daisuke Sakai; Katsumi Watanabe; Lee Chuin Chen; Kenzo Hiraoka
Journal:  Rapid Commun Mass Spectrom       Date:  2016-10-30       Impact factor: 2.419

6.  Formation of multiply charged ions from large molecules using massive-cluster impact.

Authors:  J F Mahoney; D S Cornett; T D Lee
Journal:  Rapid Commun Mass Spectrom       Date:  1994-05       Impact factor: 2.419

7.  Time-of-flight secondary ion mass spectrometry using a new primary ion beam generated by vacuum electrospray of a protic ionic liquid, propylammonium nitrate.

Authors:  Yukio Fujiwara; Naoaki Saito
Journal:  Rapid Commun Mass Spectrom       Date:  2017-11-30       Impact factor: 2.419

8.  A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometry.

Authors:  Andreas Wucher; Hua Tian; Nicholas Winograd
Journal:  Rapid Commun Mass Spectrom       Date:  2014-02-28       Impact factor: 2.419

Review 9.  Cluster secondary ion mass spectrometry of polymers and related materials.

Authors:  Christine M Mahoney
Journal:  Mass Spectrom Rev       Date:  2010 Mar-Apr       Impact factor: 10.946

10.  Energy deposition during molecular depth profiling experiments with cluster ion beams.

Authors:  Joseph Kozole; Andreas Wucher; Nicholas Winograd
Journal:  Anal Chem       Date:  2008-06-13       Impact factor: 6.986

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