| Literature DB >> 30115868 |
Andrius Dzedzickis1, Vytautas Bucinskas2, Darius Viržonis3,4, Nikolaj Sesok5, Arturas Ulcinas6, Igor Iljin7, Ernestas Sutinys8, Sigitas Petkevicius9, Justinas Gargasas10, Inga Morkvenaite-Vilkonciene11,12.
Abstract
Increasing the imaging rate of atomic force microscopy (AFM) without impairing of the imaging quality is a challenging task, since the increase in the scanning speed leads to a number of artifacts related to the limited mechanical bandwidth of the AFM components. One of these artifacts is the loss of contact between the probe tip and the sample. We propose to apply an additional nonlinear force on the upper surface of a cantilever, which will help to keep the tip and surface in contact. In practice, this force can be produced by the precisely regulated airflow. Such an improvement affects the AFM system dynamics, which were evaluated using a mathematical model that is presented in this paper. The model defines the relationships between the additional nonlinear force, the pressure of the applied air stream, and the initial air gap between the upper surface of the cantilever and the end of the air duct. It was found that the nonlinear force created by the stream of compressed air (aerodynamic force) prevents the contact loss caused by the high scanning speed or the higher surface roughness, thus maintaining stable contact between the probe and the surface. This improvement allows us to effectively increase the scanning speed by at least 10 times using a soft (spring constant of 0.2 N/m) cantilever by applying the air pressure of 40 Pa. If a stiff cantilever (spring constant of 40 N/m) is used, the potential of vertical deviation improvement is twice is large. This method is suitable for use with different types of AFM sensors and it can be implemented practically without essential changes in AFM sensor design.Entities:
Keywords: atomic force microscopy; cantilever’s mathematical model; dynamic characteristics; high speed; nonlinear stiffness
Year: 2018 PMID: 30115868 PMCID: PMC6111552 DOI: 10.3390/s18082694
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Dynamic model of the atomic force microscopy (AFM) mechanical sensor system.
Figure 2AFM sensor system, modified by implementing an air duct.
Figure 3Schematic Simulink diagram of mathematical model: δ—coordinate of kinematic excitation, η1, γ1, η2, γ2—output coordinates.
Figure 4Interaction of the cantilever probe surface to the calibration grate: (a) front slope and (b) rear slope.
Figure 5Real time domain kinematic input signal for a scanning speed of 112 μm/s from a square surface profile.
Figure 6Air supply system.
Main parameters of modelled cantilevers.
| Parameter | Case 1: Stiff Cantilever | Case 2: Soft Cantilever |
|---|---|---|
| Constant, | 0.0009 | 0.0009 |
| Length, | 117 μm | 450 μm |
| Mass, | 5.31 × 10−11 kg | 9.53 × 10−11 kg |
| Mass, | 2.65 × 10−11 kg | 4.77 × 10−11 kg |
| Resonant Frequency, | 320 kHz | 13 kHz |
| Size of the initial gap, Δ0 | 0.4 mm | 0.4 mm |
| Diameter of air duct | 0.2 mm | 0.2 mm |
| Spring Constant, | 40 N/m | 0.2 N/m |
| Thickness, | 3.5 μm | 2 μm |
| Width, | 33 μm | 50 μm |
| Young’s modulus, | 310 GPa | 310 GPa |
| Manufacturer | Bruker | NanoWorld Services |
| Type | NCHV | CONTR |
Figure 7Experimental results of cantilever’s vertical displacement at different applied pressures.
Figure 8Comparison between the modelled and measured cantilever’s displacement, using a stiff cantilever (case 1 in the Table 1), and applying a scanning speed 112 µm/s. 1—experiment with non-modified AFM sensor; 2—response of non-modified AFM sensor from model; 3—theoretical profile of calibration grating.
Figure 9Modelling results of the displacement of the stiff cantilevers (case 1 in the Table 1). (a) Scanning speed 11.2 mm/s, (b) Scanning speed 1120 mm/s. Applied pressure: 60 Pa; 1—excitation signal; 2—response of non-modified AFM sensor; 3—response of modified sensor.
Figure 10Modelling results of the displacement of the soft cantilevers (case 2 in Table 1). (a) Scanning speed 112 µm/s; (b) Scanning speed 1120 µm/s. Applied pressure 60 Pa. 1—excitation signal; 2—response of non-modified AFM sensor; 3—response of modified sensor.
Figure 11Modelling results of the displacement of the soft cantilevers (case 2 in the Table 1). (a) Applied pressure of 40.0 Pa. (b) Applied pressure of 20.0 Pa. Scanning speed of 1120 µm/s. 1—excitation signal; 2—response of the non-modified AFM sensor; 3—response of the modified sensor.