Depth of field extension and objective space depth measurement based on wavefront imaging.

When all the parts of the wavefront imaging system are kept static after wavefront measuring, the target's images are blurry, because the depth of field (DOF) of the system affects the imaging quality. In this paper, the method for extending the DOF of the wavefront imaging system through an integrated architecture of a liquid-crystal microlens array (LCMLA) powered by electricity and a common photosensitive array, is presented. The DOF can be extended remarkably only by stitching together several sub-images of the LCMLA. The problem that the wavefronts and imaging results are insensitive to the objective depth is also solved. Optimal driving voltage signals are found out according to Sobel mean gradient to efficiently calibrate the depth of objective space in order to quantitatively measure the depth. The approach indicates a viable way to effectively extend the DOF of imaging micro-systems and to measure the geometrical depth of targets at the same time.