Literature DB >> 30095919

Atomic Layer Etching: Rethinking the Art of Etch.

Keren J Kanarik1, Samantha Tan1, Richard A Gottscho1.   

Abstract

Atomic layer etching (ALE) is the most advanced etching technique in production today. In this Perspective, we describe ALE in comparison to long-standing conventional etching techniques, relating it to the underlying principles behind the ancient art of etching. Once considered too slow, we show how leveraging plasma has made ALE a thousand times faster than earlier approaches. While Si is the case study ALE material, prospects are better for strongly bound materials such as C, Ta, W, and Ru. Among the ALE advantages discussed, we introduce an ALE benefit with potentially broad application-the ALE smoothing effect-in which the surface flattens. Finally, regarding its well-established counterpart of atomic layer deposition (ALD), we discuss the combination of ALE and ALD in tackling real world challenges at sub-10 nm technology nodes.

Entities:  

Year:  2018        PMID: 30095919     DOI: 10.1021/acs.jpclett.8b00997

Source DB:  PubMed          Journal:  J Phys Chem Lett        ISSN: 1948-7185            Impact factor:   6.475


  3 in total

1.  Molecular mechanisms of atomic layer etching of cobalt with sequential exposure to molecular chlorine and diketones.

Authors:  Mahsa Konh; Chuan He; Xi Lin; Xiangyu Guo; Venkateswara Pallem; Robert L Opila; Andrew V Teplyakov; Zijian Wang; Bo Yuan
Journal:  J Vac Sci Technol A       Date:  2019-02-26       Impact factor: 2.427

2.  Development of a Noninvasive Real-Time Ion Energy Distribution Monitoring System Applicable to Collisional Plasma Sheath.

Authors:  Inho Seong; Sijun Kim; Youngseok Lee; Chulhee Cho; Jangjae Lee; Wonnyoung Jeong; Yebin You; Shinjae You
Journal:  Sensors (Basel)       Date:  2022-08-20       Impact factor: 3.847

Review 3.  Plasma-Assisted Nanofabrication: The Potential and Challenges in Atomic Layer Deposition and Etching.

Authors:  William Chiappim; Benedito Botan Neto; Michaela Shiotani; Júlia Karnopp; Luan Gonçalves; João Pedro Chaves; Argemiro da Silva Sobrinho; Joaquim Pratas Leitão; Mariana Fraga; Rodrigo Pessoa
Journal:  Nanomaterials (Basel)       Date:  2022-10-06       Impact factor: 5.719

  3 in total

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