Literature DB >> 30090909

Graphite-based selectorless RRAM: improvable intrinsic nonlinearity for array applications.

Ying-Chen Chen1, Szu-Tung Hu, Chih-Yang Lin, Burt Fowler, Hui-Chun Huang, Chao-Cheng Lin, Sungjun Kim, Yao-Feng Chang, Jack C Lee.   

Abstract

Selectorless graphite-based resistive random-access memory (RRAM) has been demonstrated by utilizing the intrinsic nonlinear resistive switching (RS) characteristics, without an additional selector or transistor for low-power RRAM array application. The low effective dielectric constant value (k) layer of graphite or graphite oxide is utilized, which is beneficial in suppressing sneak-path currents in the crossbar RRAM array. The tail-bits with low nonlinearity can be manipulated by the positive voltage pulse, which in turn can alleviate variability and reliability issues. Our results provide additional insights for built-in nonlinearity in 1R-only selectorless RRAMs, which are applicable to the low-power memory array, ultrahigh density storage, and in-memory neuromorphic computational configurations.

Entities:  

Year:  2018        PMID: 30090909     DOI: 10.1039/c8nr04766a

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  4 in total

1.  Self-Powered Resistance-Switching Properties of Pr0.7Ca0.3MnO3 Film Driven by Triboelectric Nanogenerator.

Authors:  Yanzi Huang; Lingyu Wan; Jiang Jiang; Liuyan Li; Junyi Zhai
Journal:  Nanomaterials (Basel)       Date:  2022-06-27       Impact factor: 5.719

2.  A Novel Resistive Switching Identification Method through Relaxation Characteristics for Sneak-path-constrained Selectorless RRAM application.

Authors:  Ying-Chen Chen; Chao-Cheng Lin; Szu-Tung Hu; Chih-Yang Lin; Burt Fowler; Jack Lee
Journal:  Sci Rep       Date:  2019-08-27       Impact factor: 4.379

3.  Post-Moore Memory Technology: Sneak Path Current (SPC) Phenomena on RRAM Crossbar Array and Solutions.

Authors:  Ying-Chen Chen; Chao-Cheng Lin; Yao-Feng Chang
Journal:  Micromachines (Basel)       Date:  2021-01-03       Impact factor: 2.891

4.  Resistance state evolution under constant electric stress on a MoS2 non-volatile resistive switching device.

Authors:  Xiaohan Wu; Ruijing Ge; Yifu Huang; Deji Akinwande; Jack C Lee
Journal:  RSC Adv       Date:  2020-11-19       Impact factor: 4.036

  4 in total

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