| Literature DB >> 30061634 |
M Bluschke1,2, A Frano3,4,5, E Schierle2, D Putzky1, F Ghorbani1, R Ortiz1, H Suzuki1, G Christiani1, G Logvenov1, E Weschke2, R J Birgeneau3, E H da Silva Neto6, M Minola1, S Blanco-Canosa7,8,9, B Keimer10.
Abstract
Incommensurate charge order (CO) has been identified as the leading competitor of high-temperature superconductivity in all major families of layered copper oxides, but the perplexing variety of CO states in different cuprates has confounded investigations of its impact on the transport and thermodynamic properties. The three-dimensional (3D) CO observed in YBa2Cu3O6+x in high magnetic fields is of particular interest, because quantum transport measurements have revealed detailed information about the corresponding Fermi surface. Here we use resonant X-ray scattering to demonstrate 3D-CO in underdoped YBa2Cu3O6+x films grown epitaxially on SrTiO3 in the absence of magnetic fields. The resonance profiles indicate that Cu sites in the charge-reservoir layers participate in the CO state, and thus efficiently transmit CO correlations between adjacent CuO2 bilayer units. The results offer fresh perspectives for experiments elucidating the influence of 3D-CO on the electronic properties of cuprates without the need to apply high magnetic fields.Entities:
Year: 2018 PMID: 30061634 PMCID: PMC6065363 DOI: 10.1038/s41467-018-05434-8
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fitting of the 3D-CO peaks
| Thickness (nm) | Peak area from | Peak area from | Correlation length along | Correlation length along | ||
|---|---|---|---|---|---|---|
| 41 | 50 | — | — | — | — | — |
| 50 | 50 | −0.329(1) | 0.7(1) | 2.2(2) | 8(1) | 6(1) |
| 53 | 50 | −0.329(1) | 1.7(2) | 10(1) | 10(1) | 6(1) |
| 55 | 50 | −0.329(1) | 0.9(1) | 4.3(4) | 8(1) | 5(1) |
| 62 | 50 | — | — | — | — | — |
| 53 | 20 | −0.324(1) | 0.7(2) | 0.8(2) | 3(1) | 3(1) |
Fit parameters for Lorentzian fits to the 3D-CO peak measured at 12 K in a series of YBCO thin films grown on STO (100). The raw data for the 50 nm films is shown in Fig. 2e, f and for the 20 nm film in Fig. 1c. Since the 3D-CO is still observable in the 50 nm films at 300 K, fluorescence backgrounds of the type shown in Fig. 2c, d, f (dashed lines) were subtracted from the 12 K data before fitting. In contrast the 3D-CO reflection in the 20 nm film is broader, making necessary the subtraction of the 300 K data (Fig. 1c, red points) before fitting. Errors in the tabulated values were estimated from a sensitivity analysis of the various background subtraction procedures
Fig. 2Temperature and doping dependence. a–d Temperature dependence of the scattering intensity along the (H 0 1) reciprocal space direction for two 50 nm films with Tc = 53 K (a, c) and 55 K (b, d). The backgrounds (dashed lines) in c, d were achieved by slightly detuning the detector angle away from the Bragg condition, and then subtracted before integrating to produce the normalized data points in a, b (blue circles). For comparison the temperature dependent intensity of the 2D-CO rod collected at L = 1.47 is shown in a (red triangles). e Scattering intensity at 12 K along (H 0 1) for five YBCO films of equal thickness (50 nm), but varying doping, as indicated by variation in the superconducting Tc (see “Methods”). The commensurate momentum transfer is indicated by the dashed vertical line. f L-scan of the 3D-CO reflection for the 50 nm films with Tc = 50, 53, and 55 K. The background was obtained in the same manner as described for c, d. g Same data as in f after background subtraction (black circles), and fitting with Lorentzian profiles (solid red line). a–g All data were collected using σ polarized X-rays tuned to the Cu L3 resonance. For clarity, vertical offsets were added to the curves in e–g. Although our data does contain statistical noise, the error in our analysis is dominated by the uncertainty in determining the intrinsic background signal. Accordingly, the error bars in a, b were estimated from a sensitivity analysis of the background subtraction procedure
Fig. 1Reciprocal space mapping. Three YBCO films grown on STO (001) are studied; a, d 50 nm, Tc = 53 K; b, e 50 nm, Tc = 55 K; c, f 20 nm, Tc = 53 K. Scattering data were collected using σ polarized photons tuned to the Cu L3-absorption edge. Panels a–c show the high and low temperature scattering intensity along the reciprocal space direction (H 0 1). Panels d–f exhibit reciprocal space maps in the H−L plane, these are produced by subtracting the scattered intensity detected at 300 K from the equivalent map measured at low temperature. The color maps were smoothed using a Gaussian filter
Fig. 3Photon energy and polarization dependence. a–d Comparison of various energy dependent scattering intensities across the Cu L3 edge. The data in a–c were measured on a 50 nm YBCO thin film grown on SrTiO3 (no chain order), whereas the data in d were collected from a single crystal of ortho-II ordered YB2Cu3O6.55. e Scattering geometry used to study the 3D-CO reflection at q3D. f Polarization dependence of the 3D-CO reflection as measured in e, and with photon energy tuned to the Cu L3 edge