| Literature DB >> 30035544 |
Jairo Velasco1,2, Juwon Lee1, Dillon Wong1, Salman Kahn1, Hsin-Zon Tsai1, Joseph Costello1, Torben Umeda1, Takashi Taniguchi3, Kenji Watanabe3, Alex Zettl1,4,5, Feng Wang1,4,5, Michael F Crommie1,4,5.
Abstract
Graphene p-n junctions provide an ideal platform for investigating novel behavior at the boundary between electronics and optics that arise from massless Dirac Fermions, such as whispering gallery modes and Veselago lensing. Bilayer graphene also hosts Dirac Fermions, but they differ from single-layer graphene charge carriers because they are massive, can be gapped by an applied perpendicular electric field, and have very different pseudospin selection rules across a p-n junction. Novel phenomena predicted for these massive Dirac Fermions at p-n junctions include anti-Klein tunneling, oscillatory Zener tunneling, and electron cloaked states. Despite these predictions there has been little experimental focus on the microscopic spatial behavior of massive Dirac Fermions in the presence of p-n junctions. Here we report the experimental manipulation and characterization of massive Dirac Fermions within bilayer graphene quantum dots defined by circular p-n junctions through the use of scanning tunneling microscopy-based (STM) methods. Our p-n junctions are created via a flexible technique that enables realization of exposed quantum dots in bilayer graphene/hBN heterostructures. These quantum dots exhibit sharp spectroscopic resonances that disperse in energy as a function of applied gate voltage. Spatial maps of these features show prominent concentric rings with diameters that can be tuned by an electrostatic gate. This behavior is explained by single-electron charging of localized states that arise from the quantum confinement of massive Dirac Fermions within our exposed bilayer graphene quantum dots.Entities:
Keywords: Electron optics; anti-Klein tunneling; bilayer graphene; pn junctions; quantum dots
Year: 2018 PMID: 30035544 DOI: 10.1021/acs.nanolett.8b01972
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189