| Literature DB >> 30027062 |
Jijie Huang1, Xuejing Wang1, Nicki L Hogan2, Shengxiang Wu2, Ping Lu3, Zhe Fan1, Yaomin Dai4, Beibei Zeng4, Ryan Starko-Bowes5, Jie Jian1, Han Wang1, Leigang Li1, Rohit P Prasankumar4, Dmitry Yarotski4, Matthew Sheldon2, Hou-Tong Chen4, Zubin Jacob5, Xinghang Zhang1, Haiyan Wang1,5.
Abstract
Nanoscale metamaterials exhibit extraordinary optical properties and are proposed for various technological applications. Here, a new class of novel nanoscale two-phase hybrid metamaterials is achieved by combining two major classes of traditional plasmonic materials, metals (e.g., Au) and transition metal nitrides (e.g., TaN, TiN, and ZrN) in an epitaxial thin film form via the vertically aligned nanocomposite platform. By properly controlling the nucleation of the two phases, the nanoscale artificial plasmonic lattices (APLs) consisting of highly ordered hexagonal close packed Au nanopillars in a TaN matrix are demonstrated. More specifically, uniform Au nanopillars with an average diameter of 3 nm are embedded in epitaxial TaN platform and thus form highly 3D ordered APL nanoscale metamaterials. Novel optical properties include highly anisotropic reflectance, obvious nonlinear optical properties indicating inversion symmetry breaking of the hybrid material, large permittivity tuning and negative permittivity response over a broad wavelength regime, and superior mechanical strength and ductility. The study demonstrates the novelty of the new hybrid plasmonic scheme with great potentials in versatile material selection, and, tunable APL spacing and pillar dimension, all important steps toward future designable hybrid plasmonic materials.Entities:
Keywords: artificial plasmonic lattice; metal–nitride nanocomposites; metamaterials; plasmonics; self‐assembly; vertically aligned nanocomposite
Year: 2018 PMID: 30027062 PMCID: PMC6051386 DOI: 10.1002/advs.201800416
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 16.806
Figure 1a) Schematic illustration of the designed TaN–Au metamaterial with ordered honeycomb‐like Au nanopillar lattice. b) Low‐magnification plan‐view TEM image presents the hexagonal lattice in a large scale. c) Top view of the schematic illustration.
Figure 23D microstructural characteristics of TaN–Au thin film on MgO substrate. a) 3D‐viewed diagram of TaN–Au thin film generated by plan‐view and cross‐sectional transmission electron microscopy (TEM) images. b) Typically plan‐view STEM image of the epitaxial TaN–Au film with c) corresponding EDS mapping of selected area. d) High‐resolution plan‐view STEM HAADF image of the film with e) its corresponding masked inverse FFT image. f) Typically cross‐sectional STEM image of the film with g) corresponding EDS mapping of selected area. h) High resolution cross‐sectional STEM HAADF image of the film with i) its corresponding masked inverse FFT image.
The list of theoretical in‐plane (IP) and out‐of‐plane (OP) lattice misfit, the dislocation spacing between the materials and the substrates in this work, calculated by the bulk lattice parameters at room temperature
| Misfit ratio: 2( | Estimated misfit dislocation spacing: | |
|---|---|---|
| TiN/MgO (IP) | −0.9 | 4.86 |
| Au/MgO (IP) | 3.55 | 5.82 |
| TaN/MgO (IP) | −3.68 | 5.82 |
| Au/STO (IP) | −4.02 | 4.96 |
| TiN/STO (IP) | −8.44 | 2.41 |
| TaN/STO (IP) | −11.24 | 1.83 |
| TiN/Au (OP) | 4.43 | 4.69 |
| TaN/Au (OP) | 7.23 | 2.91 |
Figure 3Normalized Raman spectra of a) TaN and TaN–Au on MgO, and b) TiN and TiN–Au on MgO; The insets are their corresponding schematic illustrations. Normalized SHG intensity as a function of incident polarization angle with output polarization fixed at c) 0° (P‐out) and d) 90° (S‐out). The insets are their corresponding polar plots of measured SHG intensity versus incident polarization angle.
Figure 4a) Comparison of the experimental and simulated reflections of the TaN with and without gold inclusion. c,d) The electric field enhancement at 450 and 600 nm, respectively, of b) the model geometry composed of gold pillars with a TaN cladding in a matrix of 20:80 TaN:Ta3N5 on MgO. Complex dielectric functions of e) TaN–Au and f) TiN–Au.
Figure 5a) TiN–Au film deposited on a large‐scale curved glass. b) Multiple load–displacement curves of b) TaN–Au, d) TiN, and e) TiN–Au, with the inset of a typical SPM image of the film after nanoindentation. c) H and E of TaN–Au measured at various locations. f) Comparison of H and E of TiN and TiN–Au measured at various locations.