Shearlet-based measures of entropy and complexity for two-dimensional patterns.

New spatial entropy and complexity measures for two-dimensional patterns are proposed. The approach is based on the notion of disequilibrium and is built on statistics of directional multiscale coefficients of the fast finite shearlet transform. Shannon entropy and Jensen-Shannon divergence measures are employed. Both local and global spatial complexity and entropy estimates can be obtained, thus allowing for spatial mapping of complexity in inhomogeneous patterns. The algorithm is validated in numerical experiments with a gradually decaying periodic pattern and Ising surfaces near critical state. It is concluded that the proposed algorithm can be instrumental in describing a wide range of two-dimensional imaging data, textures, or surfaces, where an understanding of the level of order or randomness is desired.