Literature DB >> 29994179

Depth from a Light Field Image with Learning-Based Matching Costs.

Hae-Gon Jeon, Jaesik Park, Gyeongmin Choe, Jinsun Park, Yunsu Bok, Yu-Wing Tai, In So Kweon.   

Abstract

One of the core applications of light field imaging is depth estimation. To acquire a depth map, existing approaches apply a single photo-consistency measure to an entire light field. However, this is not an optimal choice because of the non-uniform light field degradations produced by limitations in the hardware design. In this paper, we introduce a pipeline that automatically determines the best configuration for photo-consistency measure, which leads to the most reliable depth label from the light field. We analyzed the practical factors affecting degradation in lenslet light field cameras, and designed a learning based framework that can retrieve the best cost measure and optimal depth label. To enhance the reliability of our method, we augmented an existing light field benchmark to simulate realistic source dependent noise, aberrations, and vignetting artifacts. The augmented dataset was used for the training and validation of the proposed approach. Our method was competitive with several state-of-the-art methods for the benchmark and real-world light field datasets.

Year:  2018        PMID: 29994179     DOI: 10.1109/TPAMI.2018.2794979

Source DB:  PubMed          Journal:  IEEE Trans Pattern Anal Mach Intell        ISSN: 0098-5589            Impact factor:   6.226


  4 in total

1.  Implementation of a Depth from Light Field Algorithm on FPGA.

Authors:  Cristina Domínguez Conde; Jonas Philipp Lüke; Fernando Rosa González
Journal:  Sensors (Basel)       Date:  2019-08-15       Impact factor: 3.576

2.  Robust Depth Estimation for Light Field Microscopy.

Authors:  Luca Palmieri; Gabriele Scrofani; Nicolò Incardona; Genaro Saavedra; Manuel Martínez-Corral; Reinhard Koch
Journal:  Sensors (Basel)       Date:  2019-01-25       Impact factor: 3.576

3.  Fast and Accurate 3D Measurement Based on Light-Field Camera and Deep Learning.

Authors:  Haoxin Ma; Zhiwen Qian; Tingting Mu; Shengxian Shi
Journal:  Sensors (Basel)       Date:  2019-10-11       Impact factor: 3.576

4.  EANet: Depth Estimation Based on EPI of Light Field.

Authors:  Yunzhang Du; Qian Zhang; Dingkang Hua; Jiaqi Hou; Bin Wang; Sulei Zhu; Yan Zhang; Yun Fang
Journal:  Biomed Res Int       Date:  2021-12-28       Impact factor: 3.411

  4 in total

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