Literature DB >> 29985600

In Situ Observation of Resistive Switching in an Asymmetric Graphene Oxide Bilayer Structure.

Sungkyu Kim1,2, Hee Joon Jung1,3, Jong Chan Kim4, Kyung-Sun Lee5, Sung Soo Park4, Vinayak P Dravid1,3, Kai He1,2, Hu Young Jeong4,5.   

Abstract

Graphene oxide decorated with oxygen functional groups is a promising candidate as an active layer in resistive switching devices due to its controllable physical-chemical properties, high flexibility, and transparency. However, the origin of conductive channels and their growth dynamics remain a major challenge. We use in situ transmission electron microscopy techniques to demonstrate that nanoscale graphene oxide sheets bonded with oxygen dynamically change their physical and chemical structures upon an applied electric field. Artificially engineered bilayer reduced graphene oxide films with asymmetric oxygen content exhibit nonvolatile write-once-read-many memory behaviors without experiencing the bubble destruction due to the efficient migration of oxygen ions. We clearly observe that a conductive graphitic channel with a conical shape evolves from the upper oxygen-rich region to the lower oxygen-poor region. These findings provide fundamental guidance for understanding the oxygen motions of oxygen-containing carbon materials for future carbon-based nanoelectronics.

Entities:  

Keywords:  bilayer structure; conductive filament; graphene oxide; in situ TEM; resistive switching

Year:  2018        PMID: 29985600     DOI: 10.1021/acsnano.8b03806

Source DB:  PubMed          Journal:  ACS Nano        ISSN: 1936-0851            Impact factor:   15.881


  3 in total

1.  Making the Most of your Electrons: Challenges and Opportunities in Characterizing Hybrid Interfaces with STEM.

Authors:  Stephanie M Ribet; Akshay A Murthy; Eric W Roth; Roberto Dos Reis; Vinayak P Dravid
Journal:  Mater Today (Kidlington)       Date:  2021-06-19       Impact factor: 31.041

Review 2.  Decade of 2D-materials-based RRAM devices: a review.

Authors:  Muhammad Muqeet Rehman; Hafiz Mohammad Mutee Ur Rehman; Jahan Zeb Gul; Woo Young Kim; Khasan S Karimov; Nisar Ahmed
Journal:  Sci Technol Adv Mater       Date:  2020-03-18       Impact factor: 8.090

3.  Low-voltage ultrafast nonvolatile memory via direct charge injection through a threshold resistive-switching layer.

Authors:  Yuan Li; Zhi Cheng Zhang; Jiaqiang Li; Xu-Dong Chen; Ya Kong; Fu-Dong Wang; Guo-Xin Zhang; Tong-Bu Lu; Jin Zhang
Journal:  Nat Commun       Date:  2022-08-06       Impact factor: 17.694

  3 in total

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