Literature DB >> 29977125

Exact eigenstates of a nanometric paraboloidal emitter and field emission quantities.

A Chatziafratis1, G Fikioris1, J P Xanthakis1.   

Abstract

The progress in field emission theory from its initial Fowler-Nordheim form is centred on the transmission coefficient. For the supply (of electrons) function one still uses the constant value due to a supply of plane-waves states. However, for emitting tips of apex radius of 1-5 nm this is highly questionable. To address this issue, we have solved the Schrödinger equation in a sharp paraboloidally shaped quantum box. The Schrödinger equation is separable in the rotationally parabolic coordinate system and we hence obtain the exact eigenstates of the system. Significant differences from the usual Cartesian geometry are obtained. (1) Both the normally incident and parallel electron fluxes are functions of the angle to the emitter axis and affect the emission angle. (2) The WKB approximation fails for this system. (3) The eigenfunctions of the nanoemitter form a continuum only in one dimension while complete discretization occurs in the other two directions. (4) The parallel electron velocity vanishes at the apex which may explain the recent spot-size measurements in near-field scanning electron microscopy. (5) Competing effects are found as the tip radius decreases to 1 nm: The electric field increases but the total supply function decreases so that possibly an optimum radius exists.

Entities:  

Keywords:  WKB approximation; Whittaker wave functions; field emission; nanoscale emitter; near-field scanning electron microscopy

Year:  2018        PMID: 29977125      PMCID: PMC6030648          DOI: 10.1098/rspa.2017.0692

Source DB:  PubMed          Journal:  Proc Math Phys Eng Sci        ISSN: 1364-5021            Impact factor:   2.704


  2 in total

1.  Extraction of emission parameters for large-area field emitters, using a technically complete Fowler-Nordheim-type equation.

Authors:  Richard G Forbes
Journal:  Nanotechnology       Date:  2012-02-10       Impact factor: 3.874

2.  Beam spot diameter of the near-field scanning electron microscopy.

Authors:  A Kyritsakis; J P Xanthakis
Journal:  Ultramicroscopy       Date:  2012-11-16       Impact factor: 2.689

  2 in total

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