| Literature DB >> 29966328 |
Banxian Ruan1,2, Qi You3,4, Jiaqi Zhu5,6, Leiming Wu7,8, Jun Guo9, Xiaoyu Dai10,11, Yuanjiang Xiang12,13.
Abstract
Transparent conducting oxides (TCOs) have appeared in the past few years as potential plasmonic materials for the development of optical devices in the near infrared regime (NIR). However, the performance of biosensors with TCOs has been limited in sensitivity and figure of merit (FOM). To improve the performance of the biosensors with TCOs, a biosensor based on long-range surface plasmon with Ga-doped zinc oxide (GZO) is proposed. It is shown that a larger FOM with a 2~7 times enhancement compared to the traditional surface plasmon polaritons (SPPs) sensor and higher detection accuracy (DA) can be realized in our proposed sensor compared with the surface plasmon resonance (SPR) sensor with GZO. Therefore, this sensor can be used to detect biological activity or chemical reactions in the near infrared region.Entities:
Keywords: Ga-doped zinc oxide; SPR biosensor; long-range surface plasmon resonance
Mesh:
Substances:
Year: 2018 PMID: 29966328 PMCID: PMC6068737 DOI: 10.3390/s18072098
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1(a) Schematic diagram of a surface plasmon resonance (SPR) sensor based on Ga-doped zinc oxide (GZO); and (b) schematic diagram of a long-range surface plasmon resonance(LRSPR) sensor based on GZO.
Figure 2Variation in the reflectance with the incident angle for sensors based on GZO SPR and GZO LRSPR.
Figure 3(a) The electric field distributions for an SPR sensor based on the 80 nm thick GZO; (b) the electric field distributions for a GZO-based LRSPR sensor with dD = 2000 nm, dG = 18 nm.
Figure 4(a) Variation of the reflectance with the incident angle for different refractive indices(RIs) of the dielectric layer for n = 1.33, d = 2000 nm and d = 18 nm; (b) variation in the sensitivity and detection accuracy (DA) with RI of the dielectric layer.
Figure 5(a)Variation of the reflectance with the incident angle when the thickness of the dielectric (d) changes from 2000 nm to 2800 nm; (b) variation of the FOM and DA with the increase of dielectric thickness.
Figure 6(a) Variation of the reflectance with the incident angle with the change of RI of sensing medium from 1.32 to 1.34; (b) Movement of resonance angle for the proposed GZO-based LRSPR sensor with the increase in the RI of the sensing medium; variation of sensitivity and DA (c), FOM of the LRSPR sensor and traditional SPR sensor (d) with RI of the sensing medium for a dielectric thickness of 2000 nm and GZO layer thickness of 18 nm.