| Literature DB >> 29921873 |
C G Rocha1,2,3, A R Rocha4,5, P Venezuela6, J H Garcia7,8, M S Ferreira9,10,11.
Abstract
Modern electronic structure calculations are predominantly implemented within the super cell representation in which unit cells are periodically arranged in space. Even in the case of non-crystalline materials, defect-embedded unit cells are commonly used to describe doped structures. However, this type of computation becomes prohibitively demanding when convergence rates are sufficiently slow and may require calculations with very large unit cells. Here we show that a hitherto unexplored feature displayed by several 2D materials may be used to achieve convergence in formation- and adsorption-energy calculations with relatively small unit-cell sizes. The generality of our method is illustrated with Density Functional Theory calculations for different 2D hosts doped with different impurities, all of which providing accuracy levels that would otherwise require enormously large unit cells. This approach provides an efficient route to calculating the physical properties of 2D systems in general but is particularly suitable for Dirac-point materials doped with impurities that break their sublattice symmetry.Entities:
Year: 2018 PMID: 29921873 PMCID: PMC6008397 DOI: 10.1038/s41598-018-27632-6
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Structures used in the simulations. (a) graphene with substitutional nitrogen and boron (not shown) impurities. (b) Top-adsorbed Ni atom on graphene. (c) Top and (d) side views of silicene with nitrogen, or boron substitutional impurities.
Figure 2Formation energy (Ef) for graphene doped with substitutional impurities obtained via DFT. Top (Bottom) panels are for N (B) impurities. Left panels display the formation energy Ef as a function of the unit cell size L (in units of the graphene lattice parameter, a). Right panels plot the same results as a function of 1/L. The exponents are α = 1.1 for the case of N and α = 1.89 for B. The intercepts of the dashed lines on the right panels are given by Δ1 = 0.65 eV and Δ1 = 1.12 eV for N and B, respectively.
Figure 3Top and middle panels show the formation energy (Ef) for silicene doped with substitutional impurities obtained via DFT. (a,b) panels are for N dopant whereas (c,d) panels are for B dopant. Left panels display the formation energy Ef as a function of the unit cell size L (in units of the host lattice parameter, a). Right panels plot the same results as a function of 1/L. The exponents are α = 1.91 for the case of N and α = 1.95 for B. The intercepts of the dashed lines on the right panels are given by Δ1 = 0.89 eV and Δ1 = 1.01 eV for N and B, respectively. The bottom (e,f) panels show the binding energy (Eb) of a Ni impurity top-adsorbed (T) on graphene obtained through DFT. The exponent of α = 0.45 and an intercept of Δ1 = −0.54 eV were found in this case.