| Literature DB >> 29904129 |
Yuhang Jiang1, Po-Wei Lo2,3,4, Daniel May5, Guohong Li1, Guang-Yu Guo2,3, Frithjof B Anders5, Takashi Taniguchi6, Kenji Watanabe6, Jinhai Mao7,8, Eva Y Andrei9.
Abstract
In normal metals the magnetic moment of impurity-spins disappears below a characteristic Kondo temperature which marks the formation of a cloud of conduction-band electrons that screen the local-moment. In contrast, moments embedded in insulators remain unscreened at all temperatures. What then is the fate of magnetic-moments in intermediate, pseudogap systems, such as graphene? Theory predicts that coupling to the conduction-band electrons will drive a quantum phase transition between a local-moment phase and a Kondo-screened phase. However, attempts to experimentally confirm this prediction and its intriguing consequences, such as electrostatically tunable magnetic-moments, have been elusive. Here we report the observation of Kondo-screening and the quantum phase-transition between screened and unscreened phases of vacancy magnetic moments in graphene. Using scanning tunneling spectroscopy and numerical renormalization-group calculations we show that this transition enables to control the screening of local moments by tuning the gate voltage and the local curvature of the graphene membrane.Entities:
Year: 2018 PMID: 29904129 PMCID: PMC6002358 DOI: 10.1038/s41467-018-04812-6
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Kondo peak at a single-atom vacancy in graphene. a Schematic phase diagram of the pseudo-gap Kondo effect. The critical regime (yellow) separates the Local-magnetic-moment phase from the Kondo-screened phase. Arrows represent the ground state of the system with the large arrows corresponding to the local spin and the smaller ones representing the spins of electrons in the conduction band. b Schematics of the experimental setup. c STM topography of a double layer graphene on SiO2 (G/G/SiO2). The arrow indicates an isolated vacancy (Vb = −300mV, I = 20pA, Vg = 50 V). The scale bar is 20 nm. Inset: atomic resolution topography of a single atom vacancy shows the distinctive triangular structure (4 nm × 4 nm), Vb = −200mV, I = 20pA, Vg = −27V. d dI/dV spectra at the center of a single atom vacancy (upper red curve) and on pristine graphene far from the vacancy (lower black curve). The curves are vertically displaced for clarity (Vb = −200mV, I = 20pA, Vg = 0 V). The arrow labels the Dirac point. e Same as d but for a vacancy in a G/G/BN sample (Vb = −200mV, I = 20pA, Vg = −30V). f Evolution of the measured full width at half maximum (FWHM) of the Kondo peak with temperature (black data points) shown together with the fit (blue solid line) discussed in the text. Error bars represent the linewidths uncertainty obtained from fitting the Kondo peak to a Fano lineshape. Inset: Zoom into the Kondo peak (black dotted line) together with the Fano lineshape fit (red solid line)
Fig. 2Evolution of Kondo screening with chemical potential. a dI/dV curves for a subcritical Kondo vacancy (type I in text) with reduced coupling strength Γ0/ΓC = 0.90 at the indicated values of chemical potential. Red (blue) shade indicates the presence (absence) of the Kondo peak (Vb = −200mV, I = 20pA). The chemical potential is tuned by the backgate voltage[28]. b dI/dV curves for a supercritical Kondo vacancy (type II in text) with Γ0/ΓC = 1.83
Fig. 3Chemical-potential dependence of the Kondo temperature. a Chemical potential dependence of TK obtained from the Fano lineshape fit of the Kondo peak. In the regions where the peak is absent we designated TK = 0. b NRG result for the vacancies in panel a. TK is estimated by fitting the numerically simulated Kondo peak (Supplementary Note 3)
Fig. 4Quantum phase transition and Kondo screening. a μ−Γ0 phase diagram at 4.2 K. The critical coupling ΓC (circle at Γ0/ΓC = 1.0) designates the boundary between Frozen-Impurity and the Local-Magnetic-Moment phases at μ = 0. Dotted lines represent boundaries between the phases (Supplementary Note 8). b STM topography for the G/G/SiO2 (top) and G/G/BN (bottom) samples with the same scale bar (Vb = −300mV, I = 20pA). The arrows point to the vacancies. c Typical line profile of the STM topographies of graphene on different substrates with the same scanning parameters as in b. d The evolution of the hybridization strength with the curvature. Error bars represent the uncertainty in obtaining the angle between the σ-orbital and the local graphene plane orientation from the local topography measurements. Inset: sketch of the curvature effect on the orbital hybridization