Literature DB >> 29902687

Modelling electron beam induced dynamics in metallic nanoclusters.

Daniel Knez1, Martin Schnedlitz2, Maximilian Lasserus2, Alexander Schiffmann2, Wolfgang E Ernst2, Ferdinand Hofer3.   

Abstract

We present a computational scheme to simulate beam induced dynamics of atoms in surface dominated, metallic systems. Our approach is based on molecular dynamics and Monte Carlo techniques. The model is tested with clusters comprised of either Ni, Ag or Au. We vary their sizes and apply different electron energies and cluster temperatures to elucidate fundamental relations between these experimental parameters and beam induced displacement probabilities. Furthermore, we demonstrate the capability of our code to simulate beam driven dynamics by using Ag and Au clusters as demonstration systems. Simulations of beam induced displacement and sputtering effects are compared with experimental results obtained via scanning transmission electron microscopy. The clusters in question are synthesised with exceptional purity inside inert superfluid He droplets and deposited on amorphous carbon supports. The presented results may help to understand electron beam driven processes in metallic systems.
Copyright © 2018 Elsevier B.V. All rights reserved.

Entities:  

Keywords:  Beam damage; Clusters; Electron beam induced atom dynamics; Knock-on damage; Time-resolved STEM

Year:  2018        PMID: 29902687     DOI: 10.1016/j.ultramic.2018.05.007

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  2 in total

1.  Electron beam irradiation for the formation of thick Ag film on Ag3PO4.

Authors:  João Paulo de Campos da Costa; Marcelo Assis; Vinícius Teodoro; Andre Rodrigues; Camila Cristina de Foggi; Miguel Angel San-Miguel; João Paulo Pereira do Carmo; Juan Andrés; Elson Longo
Journal:  RSC Adv       Date:  2020-06-08       Impact factor: 4.036

2.  On the passivation of iron particles at the nanoscale.

Authors:  Maximilian Lasserus; Daniel Knez; Martin Schnedlitz; Andreas W Hauser; Ferdinand Hofer; Wolfgang E Ernst
Journal:  Nanoscale Adv       Date:  2019-04-23
  2 in total

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