| Literature DB >> 29876198 |
Luping Tang1, Longbing He1,2, Lei Zhang1,2, Kaihao Yu1, Tao Xu1, Qiubo Zhang1, Hui Dong1, Chao Zhu1, Litao Sun1,2.
Abstract
The manipulation and tailoring of the structure and properties of semiconductor nanocrystals (NCs) is significant particularly for the design and fabrication of future nanodevices. Here, a novel domain-confined growth strategy is reported for controllable fabrication of individual monocrystal hollow NCs (h-NCs) in situ inside a transmission electron microscope, which enables the atomic scale monitoring of the entire reaction. During the process, the preformed carbon shells serve as nanoreaction cells for the formation of CdSeS h-NCs. Electron beam (e-beam) irradiation is demonstrated to be the key activation factor for the solid-to-hollow shape transformation. The formation of CdSeS hollow NCs is also found to be sensitive to the volume ratio of the CdSe/CdS NCs to the carbon shell and only those CdSe/CdS NCs with a volume ratio in the range 0.2-0.8 are successfully converted into hollow NCs. The method paves the way to potentially use an e-beam for the in situ tailoring of individual semiconductor NCs targeted toward future nanodevice applications.Entities:
Keywords: domain‐confined growth; electron beam; hollow nanocrystals; partially sublimated nanocrystals; single‐particle manipulation
Year: 2018 PMID: 29876198 PMCID: PMC5979780 DOI: 10.1002/advs.201700213
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 16.806
Figure 1a) TEM image of CdSe/CdS NCs after thermal treatment at 340 °C for 10 min. b,c) TEM image and high‐angle annular dark field (HAADF) scanning transmission electron microscope (STEM) image of the NCs in (a) after irradiation with an electron beam (e‐beam) at 200 °C for 25 min; these images confirm that hollow structures are formed. The corresponding schematic illustrations of two typical shape transformations (i and ii) upon e‐beam irradiation are shown below (a) and (b). Similarly, a representative EDX spectrum from the NCs shown in (c) is included below (c); the signals of Cd, Se, and S can be observed. d) 1–7 show the magnified TEM images of the hollow NCs in (b).
Figure 2a–e) Captured time‐series video frames illustrating the domain‐confined growth of partially sublimated CdSe/CdS NCs induced by e‐beam irradiation in vacuum at 200 °C; prior to e‐beam, the NCs were heated at 340 °C for 10 min in a TEM equipped with a heating sample holder. Growth schemes and high‐resolution transmission electron microscopy (HRTEM) images of particle 2 indicated in (a) are shown below the corresponding images (a)–(e). f–o) (1) Partially sublimated NCs are formed after annealing at 340 °C for 10 min. (2) Isolated regions where growth of a new phase occurs randomly along the inside surface of the carbon shell, while the rest of the NCs continue to sublimate; the interface between the liquid‐like phase and the gaseous fraction within the carbon shell forms a deep V‐shaped crater [indicated by the red solid line in (l)]. (3) Isolated regions grow larger and other lattice planes are gradually assimilated into the lattice plane denoted by the arrows. (4) The newly added crystal planes grow into a whole larger crystal covering the entire surface with lattice spacing of ≈3.4 Å, which is in‐between CdSe ({002}‐3.5 Å) and CdS ({002}‐3.3 Å); this finding implies that the composition of the new crystal could be CdSeS {002}. (5) The formation of a hollow structure is clearly illustrated.
Figure 3a) Representative HRTEM image of a hollow structure showing lattice fringes with spacing corresponding to CdSeS ({002}‐3.4 Å and {101}‐3.2 Å). Fourier transform of the image in the area enclosed by red dashed lines is shown in the inset. b) HAADF‐STEM image of hollow NCs. c–e) S, Se, and Cd elemental maps obtained from EDX mapping indicating that the elements are almost evenly distributed in the hollow NCs. f) Energy transfer efficiency (E t) from 200 keV electrons to Cd (blue), Se (red), and S (green) as a function of the scattering angle θ. Horizontal dashed lines indicate the limit beyond which, the transferred energy is greater than the binding energy of CdSe (gray) and CdS (black) and is sufficient to induce the sublimation of atoms.
Figure 4a) Model used to calculate the residual volume (V re) of the partially sublimated CdSe/CdS NC. V re can be estimated from the height marked by H using the spherical cap model (i.e., ). b) TEM images of the typical three types of shape evolution. Type‐i is where there is no significant void in the center of the NC after e‐beam irradiation. Type‐ii is where the formation of h‐NC after e‐beam irradiation is clearly seen. Type‐iii is where the residual NC maintains the island shape. Statistical calculation of a number of NCs indicates that the H/R values for type‐i, type‐ii, and type‐iii are around 1.4–2, 0.6–1.4, and 0–0.6, respectively. Accordingly, the residual CdSe/CdS NCs are divided into three sorts depending on the value of V re, i.e., V > ≈ 4/5V (yellow), (blue), and V re < ≈ 1/5V(green). c) Percentage yield of CdSeS h‐NCs formation starting from treated CdSe/CdS NCs.