| Literature DB >> 29801284 |
G Dabos, A Manolis, S Papaioannou, D Tsiokos, L Markey, J-C Weeber, A Dereux, A L Giesecke, C Porschatis, B Chmielak, N Pleros.
Abstract
We demonstrate wavelength-division-multiplexed (WDM) 200 Gb/s (8 × 25 Gb/s) data transmission over 100 μm long aluminum (Al) surface-plasmon-polariton (SPP) waveguides on a Si3N4 waveguide platform at telecom wavelengths. The Al SPP waveguide was evaluated in terms of signal integrity by performing bit-error-rate (BER) measurements that revealed error-free operation for all eight 25 Gb/s non-return-to-zero (NRZ) modulated data channels with power penalties not exceeding 0.2 dB at 10-9. To the best of our knowledge, this is the first demonstration of WDM enabled data transmission over complementary-metal-oxide-semiconductor (CMOS) SPP waveguides fueling future development of CMOS compatible plasmo-photonic devices for on-chip optical interconnections.Entities:
Year: 2018 PMID: 29801284 DOI: 10.1364/OE.26.012469
Source DB: PubMed Journal: Opt Express ISSN: 1094-4087 Impact factor: 3.894