| Literature DB >> 29726491 |
Abstract
In this tutorial, we present a general model linking the data provided by any optical diffraction microscope to the sample permittivity. Our analysis is applicable to essentially all microscope configurations, in transmission or reflection mode, using scanning or full-field illumination, with or without interferometric measurements. We include also a generalization of our analysis to vector fields.Year: 2018 PMID: 29726491 DOI: 10.1364/JOSAA.35.000748
Source DB: PubMed Journal: J Opt Soc Am A Opt Image Sci Vis ISSN: 1084-7529 Impact factor: 2.129