| Literature DB >> 29714185 |
Mengning Liang1, Ross Harder2, Ian Robinson3.
Abstract
Focused synchrotron beams can influence a studied sample via heating, or radiation pressure effects due to intensity gradients. The high angular sensitivity of rotational X-ray tracking of crystalline particles via their Bragg reflections can detect extremely small forces such as those caused by field gradients. By tracking the rotational motion of single-crystal nanoparticles embedded in a viscous or viscoelastic medium, the effects of heating in a uniform gradient beam and radiation pressure in a Gaussian profile beam were observed. Changes in viscosity due to X-ray heating were measured for 42 µm crystals in glycerol, and angular velocities of 10-6 rad s-1 due to torques of 10-24 N m were measured for 340 nm crystals in a colloidal gel matrix. These results show the ability to quantify small forces using rotation motion of tracer particles. open access.Entities:
Keywords: radiation pressure; rotational X-ray tracking; rotational dynamics
Year: 2018 PMID: 29714185 PMCID: PMC5929357 DOI: 10.1107/S1600577518005039
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1MSD versus time for 42 µm alumina particles in glycerol at two different fluxes. The different slopes reflect the difference in viscosity due to X-ray heating.
Figure 2MSD versus time for 340 nm particles in decanoic acid at three different temperatures controlled with a Peltier heater. No systematic temperature dependence is observed.
Figure 3(a) MSD versus time lag for a single 340 nm alumina particle in decanoic acid with and without attenuation. (b) MSD versus time lag for an average of attenuated and non-attenuated particles.
Figure 4MSD versus time lag with the drift component subtracted for both high- and low-flux systems
Figure 5Torque on a spherical particle as a function of radial distance (nm) from the center of a Gaussian beam along a central axis of the beam.
Figure 6A spherical crystal in a Gaussian X-ray beam oriented at a Bragg angle will experience a radiation-pressure-induced force due to the reflected beam. Both the force and torque exerted on each volume element as a result of the Bragg scattered beam are computed as shown in (a). The torque vector field for each volume element of the crystal is computed (b). The sum gives the net torque of magnitude 2 × 10−24 N m, illustrated as a yellow arrow, on the crystal at a given location in the Gaussian beam (b). The net torque due to Bragg diffraction from a 340 nm alumina crystal at each position in a Gaussian X-ray beam (c). The beam is 1 µm FWHM and the Bragg angle is in the XZ plane. The vector color represents the Z component of torque on the crystal at that location (c).