| Literature DB >> 29690497 |
Marina V Il'ina1, Oleg I Il'in2, Yuriy F Blinov3, Alexey A Konshin4, Boris G Konoplev5, Oleg A Ageev6.
Abstract
Recent studies in nanopiezotronics have indicated that strained graphene may exhibit abnormal flexoelectric and piezoelectric properties. Similar assumptions have been made with regard to the properties of carbon nanotubes (CNTs), however, this has not so far been confirmed. This paper presents the results of our experimental studies confirming the occurrence of a surface piezoelectric effect in multi-walled CNTs under a non-uniform strain. Using atomic force microscopy, we demonstrated the piezoelectric response of multi-walled CNTs under compression and bending. The current generated by deforming an individual CNT was shown to be −24 nA. The value of the surface potential at the top of the bundle of strained CNTs varied from 268 mV to −110 mV, depending on strain type and magnitude. We showed that the maximum values of the current and the surface potential can be achieved when longitudinal strain predominates in a CNT. However, increasing the bending strain of CNTs does not lead to a significant increase in current and surface potential, due to the mutual compensation of piezoelectric charges concentrated on the CNT side walls. The results of the study offer a number of opportunities and challenges for further fundamental research on the piezoelectric properties of carbon nanotubes as well as for the development of advanced CNT-based nanopiezotronic devices.Entities:
Keywords: carbon nanotubes; flexoelectric effect; nanoelectronics; nanopiezotronics; piezoelectric effect; scanning probe microscopy; strain
Year: 2018 PMID: 29690497 PMCID: PMC5951522 DOI: 10.3390/ma11040638
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1The experimental samples of vertically aligned carbon nanotube arrays: (a,c) SEM images of samples A and B, respectively; (b,d) TEM images of samples A and B, respectively; (e) Raman spectra of samples A and B.
Figure 2The results of the piezoelectric response study: (a) an individual carbon nanotube of sample A; (b) a bundle of strained CNTs of sample B. The inserts show schematic images of the measurement process and the results of AFM force spectroscopy: 1—force is not applied to the AFM probe, 2—gradual force is applied to the AFM probe, 3—gradual force decay back to zero, 4—the AFM probe returns to initial state 1; (c) the relationship between the detected current and the applied force of the AFM probe.
Figure 3The results of the piezoelectric response of the mechanically purified substrate: (a) a SEM image of the purified area. The inset is a SEM image of the 20 × 20 μm2 area of the array and was scanned in the AFM force lithography mode; (b) the current-time correlation of the substrate straining in the AFM force spectroscopy mode. The inset shows an AFM image of the research area, schematic image of the measurement process, and the results of AFM force spectroscopy.
Figure 4AFM scanning of the surface potential of elastically strained CNTs: (a,b) topology of the surface (top) and cross section along the line (bottom) of sample A and sample B, respectively; (c,d) potential distribution of sample A and sample B, respectively.