| Literature DB >> 29671753 |
D Schroeter1, N Steinki, M Schilling, A Fernández Scarioni, P Krzysteczko, T Dziomba, H W Schumacher, D Menzel, S Süllow.
Abstract
We present a comparative study of the (magneto)transport properties, including Hall effect, of bulk, epitaxially grown thin film and nanostructured MnSi. In order to set our results in relation to published data we extensively characterize our materials, this way establishing a comparatively good sample quality. Our analysis reveals that in particular for thin film and nanostructured material, there are extrinsic and intrinsic contributions to the electronic transport properties, which by modeling the data we separate out. Finally, we discuss our Hall effect data of nanostructured MnSi under consideration of the extrinsic contributions and with respect to the question of the detection of a topological Hall effect in a skyrmionic lattice.Year: 2018 PMID: 29671753 DOI: 10.1088/1361-648X/aabf5c
Source DB: PubMed Journal: J Phys Condens Matter ISSN: 0953-8984 Impact factor: 2.333