| Literature DB >> 29631394 |
Do Hyeong Kim1, Chaoxing Wu1, Dong Hyun Park1, Woo Kyum Kim1, Hae Woon Seo2, Sang Wook Kim2, Tae Whan Kim1.
Abstract
The effects of the ZnS shell layer on the memory performances of flexible memristive devices based on quantum dots (QDs) with an InP/ZnSe/ZnS core-multishell structure embedded in a poly(methylmethacrylate) layer were investigated. The on/off ratios of the devices based on QDs with an InP/ZnSe core-shell structure and with an InP/ZnSe/ZnS core-multishell structure were approximately 4.2 × 102 and 8.5 × 103, respectively, indicative of enhanced charge storage capability in the latter. After bending, the memory characteristics of the memristive devices based on QDs with the InP/ZnSe/ZnS structure were similar to those before bending. In addition, those devices maintained the same on/off ratios for retention time of 1 × 104 s, and the number of endurance cycles was above 1 × 102. The reset voltages ranged from -2.3 to -3.1 V, and the set voltages ranged from 1.3 to 2.1 V, indicative of reliable electrical characteristics. Furthermore, the possible operating mechanisms of the devices are presented on the basis of the electron trapping and release mode.Entities:
Keywords: InP/ZnSe/ZnS core−multishell quantum dots; flexible devices; memory device; memristive device; nanocomposites
Year: 2018 PMID: 29631394 DOI: 10.1021/acsami.7b18817
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229