| Literature DB >> 29620900 |
Ching-Hua Wang1, Jean Anne C Incorvia1, Connor J McClellan1, Andrew C Yu1, Michal J Mleczko1, Eric Pop1,2,3, H-S Philip Wong1.
Abstract
Black phosphorus (BP) is a promising two-dimensional (2D) material for nanoscale transistors, due to its expected higher mobility than other 2D semiconductors. While most studies have reported ambipolar BP with a stronger p-type transport, it is important to fabricate both unipolar p- and n-type transistors for low-power digital circuits. Here, we report unipolar n-type BP transistors with low work function Sc and Er contacts, demonstrating a record high n-type current of 200 μA/μm in 6.5 nm thick BP. Intriguingly, the electrical transport of the as-fabricated, capped devices changes from ambipolar to n-type unipolar behavior after a month at room temperature. Transmission electron microscopy analysis of the contact cross-section reveals an intermixing layer consisting of partly oxidized metal at the interface. This intermixing layer results in a low n-type Schottky barrier between Sc and BP, leading to the unipolar behavior of the BP transistor. This unipolar transport with a suppressed p-type current is favorable for digital logic circuits to ensure a lower off-power consumption.Entities:
Keywords: Black phosphorus; erbium contact; low work function; scandium contact; transistors
Year: 2018 PMID: 29620900 DOI: 10.1021/acs.nanolett.7b05192
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189