| Literature DB >> 29557162 |
Meltem F Aygüler1, Alexander G Hufnagel1, Philipp Rieder2, Michael Wussler3, Wolfram Jaegermann3, Thomas Bein1, Vladimir Dyakonov2,4, Michiel L Petrus1, Andreas Baumann4, Pablo Docampo5.
Abstract
We tune the Fermi level alignment between the SnO x electron transport layer (ETL) and Cs0.05(FA0.83MA0.17)0.95Pb(I0.83Br0.17)3 and highlight that this parameter is interlinked with current-voltage hysteresis in perovskite solar cells (PSCs). Furthermore, thermally stimulated current measurements reveal that the depth of trap states in the ETL or at the ETL-perovskite interface correlates with Fermi level positions, ultimately linking it to the energy difference between the Fermi level and conduction band minimum. In the presence of deep trap states, charge accumulation and recombination at the interface are promoted, affecting the charge collection efficiency adversely, which increases the hysteresis of PSCs.Entities:
Keywords: Fermi level alignment; hysteresis; perovskite solar cells; perovskite-contact interface; tin oxide; trap depth energy
Year: 2018 PMID: 29557162 DOI: 10.1021/acsami.8b00990
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229