Literature DB >> 29554490

High quality ultrafast transmission electron microscopy using resonant microwave cavities.

W Verhoeven1, J F M van Rens1, E R Kieft2, P H A Mutsaers1, O J Luiten3.   

Abstract

Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM110 deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of 814 ± 2 pA, the root-mean-square transverse normalized emittance of the electron pulses is ɛn,x=(2.7±0.1)·10-12 m rad in the direction parallel to the streak of the cavity, and ɛn,y=(2.5±0.1)·10-12 m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is ɛn,x=ɛn,y=(2.5±0.1)·10-12 m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of 0.95 ± 0.05 eV has been measured.
Copyright © 2018 Elsevier B.V. All rights reserved.

Entities:  

Keywords:  Coherent ultrashort electron pulses; Microwave cavities; Pump–probe; Ultrafast transmission electron microscopy

Year:  2018        PMID: 29554490     DOI: 10.1016/j.ultramic.2018.03.012

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  4 in total

1.  Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities.

Authors:  W Verhoeven; J F M van Rens; W F Toonen; E R Kieft; P H A Mutsaers; O J Luiten
Journal:  Struct Dyn       Date:  2018-10-12       Impact factor: 2.920

2.  Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker.

Authors:  I G C Weppelman; R J Moerland; L Zhang; E Kieft; P Kruit; J P Hoogenboom
Journal:  Struct Dyn       Date:  2019-04-26       Impact factor: 2.920

Review 3.  Photoemission sources and beam blankers for ultrafast electron microscopy.

Authors:  Lixin Zhang; Jacob P Hoogenboom; Ben Cook; Pieter Kruit
Journal:  Struct Dyn       Date:  2019-09-27       Impact factor: 2.920

4.  Direct visualization of electromagnetic wave dynamics by laser-free ultrafast electron microscopy.

Authors:  Xuewen Fu; Erdong Wang; Yubin Zhao; Ao Liu; Eric Montgomery; Vikrant J Gokhale; Jason J Gorman; Chunguang Jing; June W Lau; Yimei Zhu
Journal:  Sci Adv       Date:  2020-10-02       Impact factor: 14.136

  4 in total

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