| Literature DB >> 29515952 |
Michal Lacko1, Peter Papp1, Iwona B Szymańska2, Edward Szłyk2, Štefan Matejčík1.
Abstract
In the present study we have performed electron collision experiments with copper carboxylate complexes: [Entities:
Keywords: FEBID; amines; dissociative electron attachment; dissociative ionization; low energy electrons interaction
Year: 2018 PMID: 29515952 PMCID: PMC5815308 DOI: 10.3762/bjnano.9.38
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.649
Figure 1A schematic structure of investigated molecules (left) [Cu2(µ-O2CC2F5)4], (right) [Cu2(EtNH2)2(µ-O2CC2F5)4], [Cu2(t-BuNH2)2(µ-O2CC2F5)4], and Cu2(s-BuNH2)2(µ-O2CC2F5)4], where A represent different amine ligands.
Figure 2Mass spectrum of [Cu2(µ-O2CC2F5)4] molecule over the range m/z 10–800 obtained at electron energy 70 eV and temperature of the beam source of ≈150 °C. The notation L = O2CC2F5 was used in the mass spectrum. The spectral range below m/z 150 and selected peaks at higher masses were measured with higher mass resolution (red line) while the range above m/z 150 was registered with lower resolution (blue line) to increase the signal.
Figure 3Relative cross sections of the dissociative ionization of the [Cu2(µ-O2CC2F5)4] molecule as a result of a ligand loss fragmentation process. Red lines represent a theoretical fits using the modified Wannier formula.
Appearance energies for selected ions from dissociation of [Cu2(µ-O2CC2F5)4] induced by electron impact ionization.
| Ion | Ion | ||||||
| 18 | H2O+• | 12.6a | 145 | Cu2F+ | 15.9a | ||
| 31 | CF+ | 11.0a | 18.3b | 289 | Cu2L+ | 11.9a | |
| 45 | COOH+ | 13.5a | 370 | Cu3LO+ | 25.7c | ||
| 50 | CF2+ | 14.4a | 452 | Cu2L2+• | 09.7a | 15.2b | |
| 63 | Cu+ | 15.7a | 515 | Cu3L2+ | 16.1a | ||
| 69 | CF3+ | 11.7a | 16.1a | 615 | Cu2L3+ | 11.4a | 15.7b |
| 100 | C2F4+• | 12.2a | 678 | Cu3L3+• | 15.7a | ||
| 119 | C2F5+ | 15.1a | |||||
aUncertainty ±0.5 eV, buncertainty ±1 eV, cuncertainty ±2 eV.
Figure 4Mass spectrum of [Cu2(EtNH2)2(µ-O2CC2F5)4] molecule over the range m/z 10–900 obtained at electron energy 70 eV and temperature of the beam source of ≈80 °C. The spectral range below m/z 200 was measured with higher mass resolution (red line), while that range above m/z 100 (blue line) and above m/z 160 (black line) was measured with lower mass resolutions to increase the signal.
Figure 5Mass spectrum of [Cu2(s-BuNH2)2(µ-O2CC2F5)4] molecule (top spectrum) over the range m/z 10–800 obtained at electron energy 70 eV and mass spectrum of [Cu2(t-BuNH2)2(µ-O2CC2F5)4] (bottom) obtained at similar conditions (temperature of the beam source of ≈100 °C). For both molecules the spectral range below m/z 200 was measured with higher mass resolution (red line) but above m/z 200 (blue line) with low mass resolutions to increase the signal. For [Cu2(s-BuNH2)2(µ-O2CC2F5)4] molecule (top spectrum) the range above m/z 250 was also measured with medium resolution (green line).
Appearance energies for selected ions from dissociation of [Cu2(EtNH2)2(µ-O2CC2F5)4] induced by electron impact ionization.
| Ion | ||
| 18 | H2O+•/NH4+ | 12.9a |
| 30 | C2H6+•/CH2NH2+ | 10.3a |
| 44 | C2H6N+/CO2+• | 11.4a |
| 45 | EtNH2+• | 9.0a |
| 69 | CF3+ | 14.1b |
| 189 | Cu3+ | 24.5d |
| 270 | CuLA+ | 14.6a |
| 288 | Cu2L+ | 12.8a |
| 316 | CuLA2+ | 12.9a |
| 334 | Cu2LA+ | 15.1b |
| 704 | Cu2L3A2+ | 11.8c |
aUncertainty ±0.5 eV, buncertainty ±1 eV, cuncertainty ±2 eV, duncertainty ±4 eV.
Appearance energies for selected ions from dissociation of [Cu2(t-BuNH2)2(µ-O2CC2F5)4] induced by electron impact ionization.
| Ion | |||
| 58 | (A–CH3)+ | 9.1a | |
| 119 | C2F5+ | 10.2a | 15.7a |
| 136 | CuA+ | 17.0b | |
| 193 | Cu | 15.2a | |
| 208 | CuA2+ | 11.1a | 15.9a |
| 298 | CuLA+ | 13.5b | |
aUncertainty ±0.5 eV, buncertainty ±1 eV.
Figure 6Photoelectron spectra of copper(II) carboxylate complexes [Cu2(EtNH2)2(µ-O2CC2F5)4] (red line/upper) and [Cu2(s-BuNH2)2(µ-O2CC2F5)4] (black line/bottom).
Figure 7Negative ions mass spectra of copper carboxylate molecules. The spectra were obtained at the energy where maximal ion count of SF6− ion production from SF6 is observed, which is close to 0 eV.
Figure 8Relative ion yields of negative products from [Cu2(µ-O2CC2F5)4] (left column), [Cu2(t-BuNH2)2(µ-O2CC2F5)4] (middle column) and [Cu2(EtNH2)2(µ-O2CC2F5)4] (right column) as function of electron energy. Each row represents the negative ion shown on the right. The energy scale was calibrated with respect to the formation of SF6− by electron attachment to SF6 that occurs at an electron energy ≈0 eV.
Figure 9Summary and visualization of the most important ion formation pathways for DI (top) and DEA (bottom).