| Literature DB >> 29507404 |
Yanli Jia1,2, Ge He1,2, Wei Hu1,2, Hua Yang1,2, Zhenzhong Yang1,2, Heshan Yu1,2, Qinghua Zhang1,2, Jinan Shi1,2, Zefeng Lin1,2, Jie Yuan1,2, Beiyi Zhu1,2, Lin Gu1,2,3, Hong Li1,2,3, Kui Jin4,5,6.
Abstract
The evolution from superconducting LiTi2O4-δ to insulating Li4Ti5O12 thin films has been studied by precisely tuning the oxygen pressure in the sample fabrication process. In superconducting LiTi2O4-δ films, with the increase of oxygen pressure, the oxygen vacancies are filled gradually and the c-axis lattice constant decreases. When the oxygen pressure increases to a certain critical value, the c-axis lattice constant becomes stable, which implies that the sample has been completely converted to Li4Ti5O12 phase. The two processes can be manifested by the angular bright-field images of the scanning transmission electron microscopy techniques. The transition temperature (T ch ) of magnetoresistance from the positive to the negative shows a nonmonotonic behavior, i.e. first decrease and then increase, with the increase of oxygen pressure. We suggest that the decrease Tch can be attributed to the suppressing of orbital-related state, and the inhomogeneous phase separated regions contribute positive MR and thereby lead to the reverse relation between Tch and oxygen pressure.Entities:
Year: 2018 PMID: 29507404 PMCID: PMC5838103 DOI: 10.1038/s41598-018-22393-8
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) The θ–2θ XRD spectra of epitaxial Li1+xTi2-xO4-δ (0 ≤ × ≤ 1/3) thin films grown on (001) MAO substrates at different PO2. (b) The φ-scan measurements of LiTi2O4-δ and Li4Ti5O12 thin films on MAO (001) in the (404) reflection. (c) The lattice constant along c axis of the samples versus PO2.
Figure 2(a) The R-T curves of Li1+xTi2-xO4-δ (0 ≤ × ≤ 1/3) thin films grown on (001) MAO substrate with different PO2 during the deposition. (b) The PO2 dependence of RRR and Tc0 of the films in (a) are plotted. The gray and red dashed lines are used to guide eyes. Tc0 is defined as the temperature where resistance is lower than 10−6 Ohm. Inset: zoom the R-T curves in Fig. 2(a) at low temperature range.
Figure 3ABF images of LiTi2O4-δ thin film in (a) pristine, (b) O2 vacancy and (c) O1 & O2 vacancy regions. (d) Structure model of LiTi2O4 projected along [110] direction, where the atomic positions of both O1 and O2 oxygen are labeled by red and blue arrow, respectively. (e) and (f) Line profiles of ABF contrast with filled yellow and red color, obtained from the corresponding yellow and red areas in (b) and (c), respectively. Atomic positions of O1 and O2 are also labeled by red and blue arrows, respectively. Note that the lower panel in (e) exhibits contrast between O1 (red arrows) and O2 (blue arrows) close to the ideal structure.
Figure 4(a) The R-T curves with increase of PO2 are defined as S1–S8 in sequence. The inset is the zoom of R-T curves. (b) The field dependence of MR of S1–S8 grown on (001) MAO substrates at 35 K. (c) The slope value A0 of MR can be obtained for various samples at different temperatures. With temperature increasing, the value of A0 changes from the positive to the negative. (d) The relationship between RRR and Tch. The gray dashed line is used to guide eyes. The shadow areas represent the uncertainties in defining Tch due to the impurities.
Figure 5(a) The EELS profiles for Ti L2,3 edges of the Li4Ti5O12 thin film. The L2 and L3 edges split into four peaks. (b) The EELS profiles for Ti L2,3 edges of the LiTi2O4-δ thin film. Only two peaks appear of L2,3 edges.