Literature DB >> 29495844

A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution.

U Zastrau1, C Rödel2, M Nakatsutsumi1, T Feigl3, K Appel1, B Chen4, T Döppner5, T Fennel6, T Fiedler3, L B Fletcher7, E Förster2, E Gamboa7, D O Gericke8, S Göde1, C Grote-Fortmann1, V Hilbert9, L Kazak6, T Laarmann10, H J Lee7, P Mabey11, F Martinez6, K-H Meiwes-Broer6, H Pauer3, M Perske3, A Przystawik12, S Roling13, S Skruszewicz2, M Shihab6, J Tiggesbäumker6, S Toleikis12, M Wünsche2, H Zacharias13, S H Glenzer7, G Gregori11.   

Abstract

We present an extreme ultraviolet (EUV) microscope using a Schwarzschild objective which is optimized for single-shot sub-micrometer imaging of laser-plasma targets. The microscope has been designed and constructed for imaging the scattering from an EUV-heated solid-density hydrogen jet. Imaging of a cryogenic hydrogen target was demonstrated using single pulses of the free-electron laser in Hamburg (FLASH) free-electron laser at a wavelength of 13.5 nm. In a single exposure, we observe a hydrogen jet with ice fragments with a spatial resolution in the sub-micrometer range. In situ EUV imaging is expected to enable novel experimental capabilities for warm dense matter studies of micrometer-sized samples in laser-plasma experiments.

Entities:  

Year:  2018        PMID: 29495844     DOI: 10.1063/1.5007950

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN: 0034-6748            Impact factor:   1.523


  2 in total

1.  Advanced high resolution x-ray diagnostic for HEDP experiments.

Authors:  A Y Faenov; T A Pikuz; P Mabey; B Albertazzi; Th Michel; G Rigon; S A Pikuz; A Buzmakov; S Makarov; N Ozaki; T Matsuoka; K Katagiri; K Miyanishi; K Takahashi; K A Tanaka; Y Inubushi; T Togashi; T Yabuuchi; M Yabashi; A Casner; R Kodama; M Koenig
Journal:  Sci Rep       Date:  2018-11-06       Impact factor: 4.379

2.  Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy.

Authors:  Mabel Ruiz-Lopez; Masoud Mehrjoo; Barbara Keitel; Elke Plönjes; Domenico Alj; Guillaume Dovillaire; Lu Li; Philippe Zeitoun
Journal:  Sensors (Basel)       Date:  2020-11-10       Impact factor: 3.576

  2 in total

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