| Literature DB >> 29488916 |
Matthew Hand1, Hongchang Wang1, Francesco Maccherozzi1, Marco Apollonio1, Jingtao Zhu2, Sarnjeet S Dhesi1, Kawal Sawhney1.
Abstract
Insertion devices are utilized at synchrotron radiation facilities around the world for their capability to provide a high-brilliance X-ray beam. APPLE-II type undulators are especially important for their capacity to switch between a variety of photon beam polarization states. A high-precision soft X-ray polarimeter has been used to investigate the polarization calibration of an APPLE-II undulator (period length λu = 64 mm) installed on beamline I06 at Diamond Light Source. Systematic measurement of the beam polarization state at a range of linear arbitrary angles has been compared with the expected result for a given set of undulator gap and row phase parameters calculated from theory. Determination of the corresponding Stokes-Poincaré parameters from the measured data reveals a discrepancy between the two. The limited number of energy/polarization combinations included in the undulator calibration tables necessitates the use of interpolated values for the missing points which is expected to contribute to the discrepancy. However, by modifying the orbit of the electron beam through the undulator by at least 160 µm it has been found that for certain linear polarizations the discrepancies can be corrected. Overall, it is suggested that complete correction of the Stokes-Poincaré parameters for all linear angles would require alteration of both these aspects.Entities:
Keywords: multilayers; polarization; synchrotron radiation; undulators
Year: 2018 PMID: 29488916 PMCID: PMC5829679 DOI: 10.1107/S1600577518001960
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1Calculated undulator parameter set covering the complete range of linear arbitrary angles. These are linearly interpolated to produce look-up tables evenly spaced in energy and LA angle for compatibility with the underlying EPICS control system used to operate the undulator.
Figure 2Schematic layout of the experimental setup with the soft X-ray polarimeter installed on the beamline I06 branch line. With four magnet rows (quadrants Q1–Q4), the APPLE-II undulator offers the capability to alter the row phases of quadrants Q2 and Q4 independently, referred to as top and bottom row phase (TRP/BRP) here, along with the gap between the two magnet row pairs. This provides the capability of selecting almost any polarization state across the entire energy range of the source.
Figure 3Stokes–Poincare parameters P 1, P 2 and P 3 from polarization measurements of light emitted by the downstream and upstream undulators at 375 eV. The polarization fraction = is also shown. Comparison with the predicted values determined from simple theory indicates that the expected linear light emitted by both undulators is slightly elliptically polarized.
Figure 4The (a) P 1 and (b) P 3 Stokes–Poincaré parameters plotted as a function of row phase and gap offset from their nominal values at LA45° form surfaces which intersect the plane (green) of P 1 = P 3 = 0 (the expected values at LA45°). The best-fit lines of intersection (blue) for the two parameters cross at a common value of the row phase and gap offset which provides an undulator setting that should minimize both P 1 and P 3 simultaneously.
Figure 5(a) Measurements of the photon beam polarization were carried out for different horizontal and vertical offsets of the electron beam orbit through the downstream undulator while the gap and row phase were set to produce LA45° light. (b) Similarly to the case where offsets in the top row phase and gap were introduced, when the P 3 parameter is plotted against the offset coordinates and a plane is formed which intersects the plane representing P 3 = 0 and provides a set of configurations which minimize P 3.
Comparison of Stokes–Poincaré parameters measured at electron beam offset positions Δx e and Δy e predicted to minimize P 3 with those from the unshifted beam
The column ‘Index’ refers to the corresponding numeric labels for the points in Fig. 5(b) ▸. Even in the worst case, the value of P 3 is reduced by a factor of nearly 60 by shifting the electron beam.
| Electron orbit offset | |||||
|---|---|---|---|---|---|
| Index | Δ | Δ |
|
|
|
| 1 | 0 | 0 | 0.000 | 0.994 | 0.084 |
| 2 | 0 | −260 | 0.000 | 1.001 | 0.000 |
| 3 | −51 | −235 | −0.001 | 1.001 | 0.001 |
| 4 | −92 | −214 | −0.003 | 1.007 | 0.001 |