Literature DB >> 29400793

Methods for quantitative infrared directional-hemispherical and diffuse reflectance measurements using an FTIR and a commercial integrating sphere.

Thomas A Blake, Timothy J Johnson, Russell G Tonkyn, Brenda M Forland, Tanya L Myers, Carolyn S Brauer, Yin-Fong Su, Bruce E Bernacki, Leonard Hanssen, Gerardo Gonzalez.   

Abstract

We have developed methods to measure the directional-hemispherical (ρ) and diffuse (ρd) reflectances of powders, liquids, and disks of powders and solid materials using a commercially available, matte gold-coated integrating sphere and Fourier transform infrared spectrometer. To determine how well the sphere and protocols produce quantitative reflectance data, measurements were made of three diffuse and two specular standards prepared by the National Institute of Standards and Technology (NIST), LabSphere Infragold and Spectralon standards, hand-loaded sulfur and talc powder samples, and water. Relative to the NIST measurements of the NIST standards, our directional hemispherical reflectance values are within ±4% for four of the standards and within ±7% for a low reflectance diffuse standard. For the three diffuse reflectance NIST standards, our diffuse reflectance values are within ±5% of the NIST values. For the two specular NIST standards, our diffuse reflectance values are an order of magnitude larger than those of NIST, pointing to a systematic error in the manner in which diffuse reflectance measurements are made for specular samples using our methods and sphere. Sources of uncertainty are discussed in the paper.

Entities:  

Year:  2018        PMID: 29400793      PMCID: PMC6193458          DOI: 10.1364/AO.57.000432

Source DB:  PubMed          Journal:  Appl Opt        ISSN: 1559-128X            Impact factor:   1.980


  15 in total

1.  Integrating-sphere system and method for absolute measurement of transmittance, reflectance, and absorptance of specular samples.

Authors:  L Hanssen
Journal:  Appl Opt       Date:  2001-07-01       Impact factor: 1.980

2.  Reflectance characteristics of reference materials used in lidar hard target calibration.

Authors:  D A Haner; R T Menzies
Journal:  Appl Opt       Date:  1989-03-01       Impact factor: 1.980

3.  Polarization of the reflectivity of paints and other rough surfaces in the infrared.

Authors:  U P Oppenheim; Y Feiner
Journal:  Appl Opt       Date:  1995-04-01       Impact factor: 1.980

4.  Laboratory intercomparison study of pressed polytetrafluoroethylene powder reflectance standards.

Authors:  V R Weidner; J J Hsia; B Adams
Journal:  Appl Opt       Date:  1985-07-15       Impact factor: 1.980

5.  Integrating Spheres for Measurements Between 0.185 microm and 12 microm.

Authors:  W G Egan; T Hilgeman
Journal:  Appl Opt       Date:  1975-05-01       Impact factor: 1.980

6.  Intensity-value corrections for integrating sphere measurements of solid samples measured behind glass.

Authors:  Timothy J Johnson; Bruce E Bernacki; Rebecca L Redding; Yin-Fong Su; Carolyn S Brauer; Tanya L Myers; Eric G Stephan
Journal:  Appl Spectrosc       Date:  2014       Impact factor: 2.388

7.  Evaluating portable infrared spectrometers for measuring the silica content of coal dust.

Authors:  Arthur L Miller; Pamela L Drake; Nathaniel C Murphy; James D Noll; Jon C Volkwein
Journal:  J Environ Monit       Date:  2011-12-01

8.  Multivariate curve resolution applied to infrared reflection measurements of soil contaminated with an organophosphorus analyte.

Authors:  Neal B Gallagher; Thomas A Blake; Paul L Gassman; Jeremy M Shaver; Willem Windig
Journal:  Appl Spectrosc       Date:  2006-07       Impact factor: 2.388

9.  Passive standoff detection of RDX residues on metal surfaces via infrared hyperspectral imaging.

Authors:  Thomas A Blake; James F Kelly; Neal B Gallagher; Paul L Gassman; Timothy J Johnson
Journal:  Anal Bioanal Chem       Date:  2009-07-14       Impact factor: 4.142

10.  Time-Resolved Infrared Reflectance Studies of the Dehydration-Induced Transformation of Uranyl Nitrate Hexahydrate to the Trihydrate Form.

Authors:  Timothy J Johnson; Lucas E Sweet; David E Meier; Edward J Mausolf; Eunja Kim; Philippe F Weck; Edgar C Buck; Bruce K McNamara
Journal:  J Phys Chem A       Date:  2015-09-22       Impact factor: 2.781

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  1 in total

1.  Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum.

Authors:  Jinhwa Gene; Min Yong Jeon; Sun Do Lim
Journal:  Sensors (Basel)       Date:  2021-02-07       Impact factor: 3.576

  1 in total

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