| Literature DB >> 29330513 |
A Zhukov1,2,3, M Ipatov4,5, J J Del Val4, V Zhukova4,5, V A Chernenko6,7,8.
Abstract
We have studied magnetic and structural properties of the Heusler-type Ni-Mn-Ga glass-coated microwires prepared by Tailor-Ulitovsky technique. As-prepared sample presents magnetoresistance effect and considerable dependence of magnetization curves (particularly magnetization values) on magnetic field attributed to the magnetic and atomic disorder. Annealing strongly affects the temperature dependence of magnetization and Curie temperature of microwires. After annealing of the microwires at 973 K, the Curie temperature was enhanced to about 280 K which is beneficial for the magnetic solid state refrigeration. The observed hysteretic anomalies on the temperature dependences of resistance and magnetization in the as-prepared and annealed samples are produced by the martensitic transformation. The magnetoresistance and magnetocaloric effects have been investigated to illustrate a potential technological capability of studied microwires.Entities:
Year: 2018 PMID: 29330513 PMCID: PMC5766560 DOI: 10.1038/s41598-017-19032-z
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Temperature dependence of magnetic moment measured for as-prepared Ni-Mn-Ga microwire (a) and hysteresis loops measured at different temperatures (b).
Figure 2Temperature dependence of resistance, R, for as-prepared Ni-Mn-Ga microwire measured at zero field.
Figure 3Temperature dependence of magnetic moment (a) and hysteresis loops (b) measured for the NiMnGa glass-coated microwires annealed at 973 K for 1 h.
Figure 4Temperature dependence of resistance for annealed at 973 K for 1 h Ni-Mn-Ga microwires measured at H = 0.
Figure 5ΔR/R dependence for as-prepared Ni-Mn-Ga microwires measured at different temperatures.
Figure 6ΔR/R dependences for annealed at 973 K for 1 h Ni-Mn-Ga microwires measured at different temperatures.
Figure 7Magnetization curves of Ni-Mn-Ga microwires annealed at 973 K measured at different temperatures (a); and calculated dependencies of the field-induced entropy change (b).
Figure 8Image of the cross-section (a); EDX spectra of one of the points, B7, where the chemical composition was determined (b) and optical microscopy image (c) of the Ni-Mn-Ga microwire.
Figure 9XRD patterns of as-prepared and annealed at 973 K for different times Ni-Mn-Ga microwires.