| Literature DB >> 29286313 |
Raoul-Amadeus Lorbeer1, Jan Pastow2,3, Michael Sawannia4, Peter Klinkenberg5, Daniel Johannes Förster6, Hans-Albert Eckel7.
Abstract
Ablating surfaces with a pulsed laser system in milling processes often leads to surface changes depending on the milling depth. Especially if a constant surface roughness and evenness is essential to the process, structural degradation may advance until the process fails. The process investigated is the generation of precise thrust by laser ablation. Here, it is essential to predict or rather control the evolution of the surfaces roughness. Laser ablative milling with a short pulse laser system in vacuum (≈1 Pa) were performed over depths of several 10 µm documenting the evolution of surface roughness and unevenness with a white light interference microscope. Power spectral density analysis of the generated surface data reveals a strong influence of the crystalline structure of the solid. Furthermore, it was possible to demonstrate that this effect could be suppressed for gold.Entities:
Keywords: EBSD; Hall-Petch; laser milling; micro crystalline; power spectral density; surface roughness; surface unevenness
Year: 2017 PMID: 29286313 PMCID: PMC5793548 DOI: 10.3390/ma11010050
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1(a,c) Root mean square (RMS) roughness of aluminum as well as RMS roughness for low and high frequencies. ( or = J/cm, or = J/cm, or = J/cm, or = J/cm). (b,d) RMS roughness of copper as well as RMS roughness for low and high frequencies. ( or = J/cm, or = J/cm, or = J/cm).
Figure 2(a,c): RMS roughness of graphite as well as RMS roughness for low and high frequencies. Low frequency RMS graphs are obscuring the total RMS graphs due to similar values. Milling depths above 150 µm were omitted due to rim artifacts for high milling depths. ( or = J/cm, or = J/cm, or = J/cm, ) or = J/cm. (b,d): RMS roughness of gold as well as RMS roughness for low and high frequencies. ( or = J/cm, or = J/cm, or = J/cm).
Figure 3Scheme of power spectral densities (PSD) calculation. Data was taken from aluminum sample for 32 hatching patterns and a pulse energy of ( = J/cm at 100% laser power). Orange box: Surface profile data is cropped to the region of interest. Red box: After windowing a FFT is performed resulting in power spectral density. The red circle indicates the chosen border between low and high frequencies. Blue box: PSD result after correct normalization and radial binning. The vertical line indicates the laser spot pattern frequency ().
Figure 4Cavities P060_C8 and P060_C16 ( with 8 and 16 hatching patterns) in gold, with intermediate area. (a) Wide field microscopy image. Red arrow indicates crack. (b) Surface profile images. (c) Electron Backscattered Diffraction (EBSD) image.